2017
DOI: 10.1016/j.dyepig.2017.03.008
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Synthesis and properties of new π-conjugated imidazole/carbazole structures

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Cited by 7 publications
(4 citation statements)
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“…In thin solid layers, the charge carrier mobility was measured using the technique of charge extraction by linearly increasing voltage (CELIV) . Metal-insulator-semiconductor (MIS) diode structures, similar to those described earlier, , were prepared. Onto the ITO (indium-tin oxides) electrode of the ITO/glass substrate, a SiO 2 insulator layer of 70 nm in thickness was deposited by conventional magnetron sputtering.…”
Section: Methodsmentioning
confidence: 99%
“…In thin solid layers, the charge carrier mobility was measured using the technique of charge extraction by linearly increasing voltage (CELIV) . Metal-insulator-semiconductor (MIS) diode structures, similar to those described earlier, , were prepared. Onto the ITO (indium-tin oxides) electrode of the ITO/glass substrate, a SiO 2 insulator layer of 70 nm in thickness was deposited by conventional magnetron sputtering.…”
Section: Methodsmentioning
confidence: 99%
“…34 The metal-insulatorsemiconductor structure ITO/SiO 2 /bisTTzs 3c,g,i/Al was used for the CELIV measurements described previously. 35,36 Obtained data on the mobility of electrons and holes in the 3c,g,i films are summarized in Table 3.…”
Section: Charge-carrier Mobilitiesmentioning
confidence: 99%
“…In thin solid films, the charge mobility values were measured by using the technique of charge extraction by linearly increasing voltage (CELIV) . Metal–insulator–semiconductor (MIS) diode structures, similar to those described in references, , were prepared.…”
Section: Experimental Sectionmentioning
confidence: 99%