Synthesis, Characterization and Properties of Zirconium Oxide (ZrO2)-Doped Titanium Oxide (TiO2) Thin Films Obtained via Sol-Gel Process

Boosting of Antibacterial Performance of Cellulose Based Paper Sheet via TiO2 Nanoparticles

“…Additionally, there are two small peaks located at 1128 and 1045 cm −1 for all four composite samples and for pure TiO 2 . These signals can be attributed to the vibration mode of Ti-OH and Ti-O-C band, respectively [ 41 , 42 , 43 ]. Given all above, the main difference between reference and composites samples is the occurrence of an intense signal in 400–800 cm −1 , which is characteristic for TiO 2 .…”

Photocatalytic degradation of trichloroethylene in a continuous annular reactor using Cu-doped TiO2 catalysts by sol–gel synthesis

“…The bands attributed to tetrahedral Ti-O stretching (∼820 cm −1 ) and octahedral Ti O stretching (∼560 cm −1 ) are present in xerogel samples, while the calcined samples showed the intensity of the tetrahedral Ti O band decreased and that of the octahedral Ti-O band increased [35,36] The characteristic stretching vibrations of the inorganic Ti O Ti network [37,38] are present in the calcined TiO 2 samples between 400 and 800 cm −1 are attributed to O-Ti-O from crystalline titania in the anatase form [35]. This band is broader in copper doped TiO 2 samples, one explanation could be the contribution due the stretching vibrations of Cu I -O and Cu II -O reported in other studies at 525 cm −1 [37] from CuO samples [39] .The changes of IR spectra on TiO 2 doped indicated that the addition of copper oxide affected the titanium surface oxide species and also because Fourier transform infrared (FT-IR) spectrum was sensitive to variations in particle size, shape and morphology [40].…”

Optical, photocatalytical and structural properties of TiO2 – SiO2 sol-gel coatings on high content SiO2 enamel surface

“…where n 0 is refractive index of air, ns are refractive index of substrate, T max is the maximum envelope and T min is the minimum envelope [14]. The porosity of the thin films is calculated using the following equation [15]:…”