2015
DOI: 10.1016/j.matchemphys.2015.07.002
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Synthesis of freestanding water-soluble indium oxide nanocrystals capped by alanine nitric acid via ligand exchange for thin film transistors and effects of ligands on the electrical properties

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“…For the In 2 O 3 NC TFTs with the BT-5 NC/SiO 2 system, the trapped density was estimated to be 1.4 × 10 13 , which is approximately 2 times lower than that of TFT with only SiO 2 , indicating that the use of the BT-5 NC/SiO 2 gate dielectric reduces the density of localized trap states at the dielectric channel interface. The stabilities against repeated measurements are closely related to the number of trap sites and the trap lifetime. , The trapping of electrons during the operation produced electrons that cannot be released before the next sweep; these electrons cannot participate in charge transport, leading to a significant change in the subthreshold slope and μ. As shown in Figure , BT-5 NC/SiO 2 -based TFT showed electrical stability against a repeated measurement with the same V DS for 10 V without significant drops in mobility, subthreshold slope, and on/off ratio (Figure (a)).…”
Section: Resultsmentioning
confidence: 99%
“…For the In 2 O 3 NC TFTs with the BT-5 NC/SiO 2 system, the trapped density was estimated to be 1.4 × 10 13 , which is approximately 2 times lower than that of TFT with only SiO 2 , indicating that the use of the BT-5 NC/SiO 2 gate dielectric reduces the density of localized trap states at the dielectric channel interface. The stabilities against repeated measurements are closely related to the number of trap sites and the trap lifetime. , The trapping of electrons during the operation produced electrons that cannot be released before the next sweep; these electrons cannot participate in charge transport, leading to a significant change in the subthreshold slope and μ. As shown in Figure , BT-5 NC/SiO 2 -based TFT showed electrical stability against a repeated measurement with the same V DS for 10 V without significant drops in mobility, subthreshold slope, and on/off ratio (Figure (a)).…”
Section: Resultsmentioning
confidence: 99%