2003
DOI: 10.1016/s0022-0248(02)02041-9
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Synthesis of nanocrystalline silicon carbonitride films by remote plasma enhanced chemical vapor deposition using the mixture of hexamethyldisilazane with helium and ammonia

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Cited by 39 publications
(13 citation statements)
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“…A critical examination of the Si 2p line (with peak centred around 103 eV and large FWHM of ∼3 eV) suggest that the Si is covalently bonded probably with C and N. These indicate that a possible sp 3 bonds in (C,Si) N bonds could be promoted by the doping action of Si and this imposed structural change was responsible for the different chemical composition we observed in the N 2 + implanted steel. This explanation is consistent with the recent report of the preparation of ultra hard (35 GPa) crystalline silicon carbo-nitride [16][17][18].…”
Section: Xps Characterisation Of the N 2 + Modificationsupporting
confidence: 93%
See 1 more Smart Citation
“…A critical examination of the Si 2p line (with peak centred around 103 eV and large FWHM of ∼3 eV) suggest that the Si is covalently bonded probably with C and N. These indicate that a possible sp 3 bonds in (C,Si) N bonds could be promoted by the doping action of Si and this imposed structural change was responsible for the different chemical composition we observed in the N 2 + implanted steel. This explanation is consistent with the recent report of the preparation of ultra hard (35 GPa) crystalline silicon carbo-nitride [16][17][18].…”
Section: Xps Characterisation Of the N 2 + Modificationsupporting
confidence: 93%
“…Anyway there are now serious doubts [16] as to the true existence of a crystalline carbon nitride as predicted. However more evidences [17,18] are being advanced for the existence of stoichiometric silicon carbo-nitride. We further examined the nature of the C and N bonds in the modified layer and compared with current understandings in carbon nitride films.…”
Section: Xps Characterisation Of the N 2 + Modificationmentioning
confidence: 99%
“…The synthesis was carried out by remote plasma enhanced decomposition of HMDS as single-source precursor using two gas mixtures: (HMDS+He) and (HMDS+NH 3 +He) in the temperature range 600-1073 K and total pressure of (4-6) Â 10 À2 Torr in reactor [5]. Initial P NH3 /P HMDS ratios were equal to 0.3, 0.73, 1.0, 1.7, and 2.1.…”
Section: Methodsmentioning
confidence: 99%
“…Silicon carbonitride layers have been grown by means of different methods, namely, chemical vapor deposition (CVD) at higher temperatures [17][18][19][20], use of hot filament chemical vapor deposition [21], plasma enhanced chemical vapor deposition (PECVD) [22][23][24][25][26][27][28][29][30], microwave plasma enhanced chemical vapor deposition (PECVD) [31][32][33][34][35], elec tron cyclotron resonance plasma enhanced chemical vapor deposition (PECVD) [11,12], pulsed laser dep osition [4,13], ion beam sputtering [3,36,37], and reactive magnetron sputtering [7,[38][39][40][41][42][43][44].…”
Section: Introductionmentioning
confidence: 99%