2013
DOI: 10.1557/jmr.2013.220
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Synthesis of nanostructured SnO and SnO2 by high-energy milling of Sn powder with stearic acid

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Cited by 7 publications
(4 citation statements)
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“…The resulting curve indicates a noncrystalline phase with a maximum at 2 ∼ 15.7 ∘ . Applying the Ehrenfest formula [45], 2 sin = 1.23 , the interatomic distances can be estimated, where is the wavelength of X-rays and is the half angle of diffraction. Thus, a wide distribution of distances with maximum at 6.9Å was noted.…”
Section: X-ray Diffraction and Crystallinity Estimativementioning
confidence: 99%
“…The resulting curve indicates a noncrystalline phase with a maximum at 2 ∼ 15.7 ∘ . Applying the Ehrenfest formula [45], 2 sin = 1.23 , the interatomic distances can be estimated, where is the wavelength of X-rays and is the half angle of diffraction. Thus, a wide distribution of distances with maximum at 6.9Å was noted.…”
Section: X-ray Diffraction and Crystallinity Estimativementioning
confidence: 99%
“…For example, MChT enables to improve photocatalytic properties of oxides through introduction of “intrinsic” defects into their structure (Baláž et al., 2013; Boldyrev, 2002; Buyanov et al., 2009; Lamelas, 2004; Šepelák et al., 2012). But this aspect is insufficiently studied for tin dioxide (Al-Hamdi et al., 2014; Cukrov et al., 2001; Kersen, 2002; Kersen and Sundberg, 2003; Lamelas, 2004; Manzato et al., 2014; Senna et al., 2015; Yang et al., 2004; Ye et al., 2014). The listed works are devoted to study of other physical–chemical properties and applications of tin mono- and dioxide.…”
Section: Introductionmentioning
confidence: 99%
“…Furthermore, a main amorphous halo centered at 2θ ≈ 15.7° can be identified in both pattern samples. Using the Ehrenfest equation (2Rsinθ=1.23λ) (Manzato, Trichês, De Souza, & De Oliveira, 2014) an interatomic distance of R≈ 6.9 Å was calculated for a second neighbor husk. Is important to note that the peak located at 2θ ≈ 34° and both amorphous halos have their intensity increasing when compared with the XRD pattern of in natura sample.…”
Section: X-ray Diffraction (Xrd)mentioning
confidence: 99%