“…The sharpness and intense diffraction peaks of Imp‐Ni‐Sb‐SnO 2 , ED‐Ni‐Sb‐SnO 2 , and ED‐Sb‐SnO 2 can be well assigned to tetragonal rutile SnO 2 phase (JCPDS 41–1445). It can be found that the intense diffraction peaks of samples located at 27.1°, 34.2°, 38.6°, 52.2°, 55.1°, 70.9° which can be attributed to (110), (101), (200), (211), (220), and (202) crystal planes of tetragonal rutile SnO 2 phase 20 . In addition, the diffraction peak of Imp‐Ni‐Sb‐SnO 2 , ED‐Ni‐Sb‐SnO 2 , and ED‐Sb‐SnO 2 are slightly shifted towards higher angles when compared to the Ed‐SnO 2 and standard card (JCPDS 41–1445), indicating the Sb 5+ (0.62 Å) with a smaller radius was successfully doped into the SnO 2 (0.69 Å) crystal structure 21 .…”