“…The 13 C measured conditions of pulse width, recycle delay, contact time and number of scans are 5.5 µs, 5 s, 1000 µs, and 1486, respectively, at 100.6 MHz. These conditions corresponding to 29 Si are 3 µs, 200 s, 1000 µs, and 294, respectively, at 79.4 MHz. The fracture surface of hybrid thin films were examined on the (Philips, XL-40FEG) field emission scanning electron microscope (SEM).…”