System for Testing Middle-Resolution Digitizers using Test Signal up to 20 MHz

Haasz, V.; Komarek, Milan; Roztocil, Jaroslav; Slepička, David; Suchanek, Petr

doi:10.1109/imtc.2006.328412

Cited by 7 publications

(4 citation statements)

References 2 publications

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“…The effect of close-to-carrier distortion of testing signal mentioned above was suppressed by eliminating bins in the range of about 30 kHz in vicinity to fundamental by dynamic parameters calculation. The differences in the calculated values of SINAD, ENOB, THD, SNHR, and SFDR using low-cost or high-quality configurations are smaller than reproducibility of measured results in the case of low-cost configuration (about 5 dB -see [3]). The dynamic parameters published in data sheet of producer are shown in the same table in the case of PXI digitisers.…”

Section: Resultsmentioning

confidence: 66%

Testing of Middle-resolution Digitisers at Input Signal Frequency of 1 MHz

Haasz

Komarek

Roztocil

et al. 2006

2006 International Biennial Baltic Electronics Conference

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A system for the testing of digitisers in the frequency range of 1 MHz was developed at the Dept. of Measurement, CTU FEE a few years ago. Two alternates of the system were manufactured -a precision design using special high-quality LC filters with a near-linear transfer characteristic and a low-cost design employing common LC filters using coils with ferromagnetic cores -see [1]. Both alternates were used for testing several types of middleresolution digitisers.

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Section: Resultsmentioning

confidence: 66%

Testing of Middle-resolution Digitisers at Input Signal Frequency of 1 MHz

Haasz

Komarek

Roztocil

et al. 2006

2006 International Biennial Baltic Electronics Conference

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“…The coefficients of the polynomials of the approximated non-linearity INL(n) curve (1) were computed from the histogram method [1] measured by the digitizer NI PXI 5122. Spectrally pure (filtered) testing signal (THD < -130 dB) was used for this purpose [5]. The approximation of the inverted transfer function was found applying the polynomials.…”

Section: Simulation Of Non-linearity Correctionmentioning

confidence: 99%

“…To verify the simulation results experimental measurements using two high quality digitizers (23bit Digitizer VXI HP E1430A and 24-bit Digitizer NI PXI-5922) were performed. High-quality ADC testing system at the CTU in Prague [5] was applied for this purpose. The input signal was generated by ultra-low distortion Stanford Research DS360 generator and it was subsequently filtered by bandpass filter to achieve high spectral purity of the signal.…”

Section: Experimental Verificationmentioning

confidence: 99%

Post-Correction of Adc Non-Linearity Using Integral Non-Lineatity Curve

Haasz¹,

Slepička²,

Suchanek³

2014

IJC

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The accuracy of AD conversion can be improved usin g the post-correction of digitizer non-linearity. In principle two methods could be applied – look-up table or an analytical inverse function of integral non-linearity curve (INL(n)). Look-up table can be easily implemented but it demands huge memory space particularly for high resolution ADCs. Inverse function offers flexible solution for parameterization (e.g. frequency dependence) but it also requires fast DSP for real-time correction. The data or coefficients for bot h methods are frequently determined from a histogram of acquired pure sinusoidal signal. Non-linearity curve can also be gained by another procedure demanding significantly less samples – approximation from a frequency spectrum. The correction of ADC nonlinearity by means of inverse function of INL(n) curve is analyzed in this paper and the results are presented.

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“…The lack of appropriate test signal source had initiated the design of a system for testing ADCs in the frequency range up to 20 MHz at the Dept. of Measurement, CTU FEE several years agosee [1].…”

Section: Introductionmentioning

confidence: 99%

Influence of test signal phase noise on high-resolution ADC testing

Haasz

Komarek

Roztocil

et al. 2007

2007 IEEE Instrumentation &Amp; Measurement Technology Conference IMTC 2007

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The testing of high-resolution ADCs based on the majority of standardized methods requires pure sine-wave test signal. The reason of the requirement for signal's purity is that measured ADC parameters are potentially influenced by test signal imperfections such as distortion and wideband noise but also its short term frequency changes (phase noise). The influence of signal distortion and noise has already been the subject of many contributions; an analysis of phase noise, its effect on test results and possibilities of its suppression or correction are the subject of this paper. The validity of phase noise analysis and of proposed methods is also demonstrated on experimental measurements.

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System for Testing Middle-Resolution Digitizers using Test Signal up to 20 MHz

Cited by 7 publications

References 2 publications

Testing of Middle-resolution Digitisers at Input Signal Frequency of 1 MHz

Testing of Middle-resolution Digitisers at Input Signal Frequency of 1 MHz

Post-Correction of Adc Non-Linearity Using Integral Non-Lineatity Curve

Influence of test signal phase noise on high-resolution ADC testing

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