System Level Radiation Characterization of a 1U CubeSat Based on CERN Radiation Monitoring Technology

Benchmark Between Measured and Simulated Radiation Level Data at the Mixed-Field CHARM Facility at CERN

“…The radiation environment of the CHARM facility has been studied in different contexts pertaining to radiation to electronics (R2E). Numerous tests on electronic devices have been carried out at CHARM: 1) at component level, for both cummulative effects caused by total ionizing dose (TID) [3], [4] or displacement damage (DD) [5], and stochastic effects represented by single-event effects (SEE), such as single-event latch-ups (SEL) [6]- [8] or single-event upsets (SEU) [9] and 2) at system level [10]- [13].…”

Bridging RHA Methodology From Component to System Level Applied to System-on-Modules

“…In the standard component-level RHA approach, each component within a system is typically characterized individually using a benchmark software application, then the system reliability and availability are estimated with high margins increasing the design cost [1][2][3][4]. Alternatively, in the emerging system level approach [5][6][7], the whole system embedding the final application is characterized simultaneously enabling direct obtention of system reliability. Benchmarks allow the reuse of component-level results, typically for memory components.…”

Comparison of the Total Ionizing Dose Sensitivity of a System in Package Point of Load Converter Using Both Component- and System-Level Test Approaches

“…The qualification of components that will be used for space missions requires test standards that allow the selection of components that will make up the on-board systems [1][2][3]. With the increasing use of commercial off-the-shelf (COTS) devices or the need to set up selection methodologies for new fields, such as nuclear decommissioning or NewSpace, the question of testing no longer at the component level but at the level of a system arises [4][5][6][7][8][9][10][11][12]. It is expected that testing at system level may lead to the reduction of the test effort when compared to testing at the component level of all the parts constituting the system-therefore, it may also reduce time-to-market for new products.…”