System-Level Vulnerability Assessment for EME: From Fault Tree Analysis to Bayesian Networks—Part II: Illustration to Microcontroller System

Abstract

The vulnerability of microcontroller system against high-altitude electromagnetic pulse (HEMP) is taken as an illustration to demonstrate the assessment methodology based on Bayesian networks (BN). The complete procedure is performed by two steps: the qualitative and the quantitative. The first step focuses on the analysis of three classes of properties, the electromagnetic environment, system function/structure, and their interactions. The primary BN model is built at the end of the first step. The second step investigates the BN nodes and branches one by one, which further implemented through two stages, i.e., the data acquisition and data fusion. The susceptibilities of devises are examined with the pulsed current injection. The responses of the transmission lines to HEMP are computed using the field-line coupling model. Comparing the probability density functions of the electromagnetic stresses and strengths produces the failure probabilities of the interface components. Through two-step analysis, the critical elements and coupling paths are identified and highlighted. After neglecting those unimportant factors, many BN nodes and branches are deleted. Thus, the complexity of assessment is reduced. By assigning the probability values to the simplified BN model, the system failure probability is calculated, which characterizes the system vulnerability against HEMP environment. The illustration validates the rationality and flexibility of the BN assessment methodology.

Electromagnetic Risk Analysis for EMI Impact on Functional Safety With Probabilistic Graphical Models and Fuzzy Logic

“…The application of a BN to determine a probability measure for the vulnerability of a building installation to intentional EMI (i.e. a cybersecurity issue) is described in [9]- [10], based on EM topolgy, fault tree analysis and event tree analysis. However, if there is a feedback loop (such as C2→C4→C1→C7→C2 in Fig.…”

Analysis of the Interference Effects in CMOS Image Sensors Caused by Strong Electromagnetic Pulses

“…According to the international standard IEC 61000-2-15 [4], this represents a high-power electromagnetic (HPEM) environment, which is much harsher than conventional electromagnetic compatibility (EMC) testing environments. Notably, the monitoring and diagnostic imaging equipment operating in such an environment often encounters functional failures, performance degradation, interference, and damage to electrical and electronic systems [5][6][7][8]. Therefore, it is crucial to research the electromagnetic pulse (EMP) effects of CIS in HPEM environmental conditions to not only identify their failure types and interference thresholds but also establish a basis for application evaluation and robustness.…”

Research on Electromagnetic Susceptibility of Electronic Modules in Component-Level HEMP PCI Test

“…Doing so will help prevent electromagnetic risks and improve the protective design technology of electronic systems. Probability descriptions designed to detail the vulnerability of electronic systems attacked by certain EMP [3,4] usually employ the system-level vulnerability assessment method based on Bayesian networks (BN), with the risk factors of electromagnetic environment effect (E3) and reliability theory taken into account in the stress-strength model. The damage threshold distribution of the main coupling port of the system is obtained by system-level effect threshold tests and statistical distribution fitting methods.…”