Systematic Characterization of High-Dielectric Constant Glass Materials Using THz-TDS Technique

Abstract

High-dielectric constant glasses are prerequisite for developing terahertz (THz) components and systems. Oxyfluorosilicate (OFS) glasses have been developed and their THz properties have been characterized by using THz-time domain spectroscopy (THz-TDS) measurements. High-dielectric constant (8–13) and low loss (6–9/cm) properties in the THz region have been demonstrated and their dielectric properties have been studied using the single oscillator-based model through a comparison with other multi-component silicate oxide glasses. Unified single oscillator model, which can distinguish the electronic and ionic contributions to the dielectric property, has been applied in this analysis. The physical origin of the dielectric constant enhancement and the importance of interplay between the electronic polarizability and ionicity in high-dielectric constant glasses have been revealed. This study has demonstrated the usefulness of THz-TDS technique for characterizing dielectric properties of multi-component glasses in detail.