2012
DOI: 10.1134/s1063783412090296
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Systematic features of diffusion and aggregation of intrinsic defects in dielectric crystals

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Cited by 3 publications
(5 citation statements)
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“…Below, the value of E Sav = 1.00 eV will be used as the value determined from a larger number of experimental measurements and as more reliable. The activation energy E av for the vacancies diffusion in the bulk of LiF crystals is equal to 0.60 eV [12,13]. The inequality E Sav > E av and the values of the activation energies indicate that the potential barrier separating the fluorine ion in the lat tice site from the vacant site (vacancy) in the subsur face layer is substantially greater than that in the bulk of the crystal.…”
Section: F S3mentioning
confidence: 96%
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“…Below, the value of E Sav = 1.00 eV will be used as the value determined from a larger number of experimental measurements and as more reliable. The activation energy E av for the vacancies diffusion in the bulk of LiF crystals is equal to 0.60 eV [12,13]. The inequality E Sav > E av and the values of the activation energies indicate that the potential barrier separating the fluorine ion in the lat tice site from the vacant site (vacancy) in the subsur face layer is substantially greater than that in the bulk of the crystal.…”
Section: F S3mentioning
confidence: 96%
“…It should be noted that, in the first stage of the kinetics of aggregation, the concentrations of these defects in the bulk of the crys tals are approximately equal to each other [13].…”
Section: F S3mentioning
confidence: 98%
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