Systematic Study of the Incorporation of Quantum-Coupling 2-D Materials in the FET Gate/Channel Stack for Steep Subthreshold Slope

Raju, Parameswari; Xu, Herwen; Zhu, Hao; Ioannou, Dimitris E.; Li, Qiliang

doi:10.1109/ted.2024.3382221

IEEE Trans. Electron Devices

2024

DOI: 10.1109/ted.2024.3382221

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Systematic Study of the Incorporation of Quantum-Coupling 2-D Materials in the FET Gate/Channel Stack for Steep Subthreshold Slope

Parameswari Raju,

Herwen Xu,

Hao Zhu

et al.

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Systematic Study of the Incorporation of Quantum-Coupling 2-D Materials in the FET Gate/Channel Stack for Steep Subthreshold Slope

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