2023
DOI: 10.1016/j.surfin.2023.103156
|View full text |Cite
|
Sign up to set email alerts
|

Ta interfaced CoFeB: Role of CoFeB thickness and thermal annealing in modification of structural and magnetic properties

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2024
2024
2024
2024

Publication Types

Select...
1

Relationship

0
1

Authors

Journals

citations
Cited by 1 publication
(1 citation statement)
references
References 53 publications
0
1
0
Order By: Relevance
“…For atomic level investigation of the L1 0 transformation kinetics in the films, x-ray reflectivity (XRR) and Secondary Ion Mass Spectrometry (SIMS), were used. Both of these techniques have sub-nanometer depth selectivity and are thus, ideal tools for the present investigation [34][35][36][37]. Using these techniques, we carried out depth profiling of multilayer and alloy films and studied the evolution of the FePt phase in the films as a function of annealing time during RTA.…”
Section: Introductionmentioning
confidence: 99%
“…For atomic level investigation of the L1 0 transformation kinetics in the films, x-ray reflectivity (XRR) and Secondary Ion Mass Spectrometry (SIMS), were used. Both of these techniques have sub-nanometer depth selectivity and are thus, ideal tools for the present investigation [34][35][36][37]. Using these techniques, we carried out depth profiling of multilayer and alloy films and studied the evolution of the FePt phase in the films as a function of annealing time during RTA.…”
Section: Introductionmentioning
confidence: 99%