Vanadium dioxide (VO 2 ) films, which undergo a metal−insulator transition (MIT) at 68 °C, are promising materials for switching device applications. Topotactic oxidation of vanadium sesquioxide (V 2 O 3 ) epitaxial films yields highly oriented VO 2 films. However, the effect of oxidation conditions on the MIT properties of the resulting VO 2 films has not been thoroughly explored. In this study, we investigated the effects of oxidation conditions, such as oxygen partial pressure, temperature, and time, on the topotactic transformation from V 2 O 3 to VO 2 films and fabricated high-quality VO 2 films. Thermodynamic calculations demonstrated that oxidation atmospheres with thermodynamically stable VO 2 can be formed using a gas mixture containing water vapor and hydrogen. Experiments with different oxidation parameters revealed that the optimal oxidation conditions are oxygen partial pressures ranging from 10 −20 to 10 −8 atm, oxidation temperature of 500 °C, and oxidation times exceeding 6 h. Under these conditions, V 2 O 3 was topotactically oxidized to VO 2 , and the electrical resistance of the resulting VO 2 films changed by 4.7 orders of magnitude across the MIT. This study opens new avenues for fabricating highly sensitive VO 2 -based switching devices.