“…As seen in Figure a, the peaks at 28, 47, 56, 69, 76, and 88° represent the (1 1 1), (2 2 0), (3 1 1), (4 0 0), (3 1 1), and (4 2 2) planes of silicon, which is consistent with the above HRTEM result. − A weak and broad peak can be observed at 23°, which indicates that the carbon layer is amorphous with a low graphitization degree . No existence of unknown peak demonstrates the high purity of the prepared material.…”