“…For example, r = 0, 1 2 , 1, and 2 can be considered for calculation of Seebeck coefficients when acoustic phonon scattering (or alloy, point-defect scattering), neutral impurities, optical phonon scattering, and the charge impurity scattering, respectively, dominate the conduction process. [54][55][56] Hence, it is likely from our analysis that the scattering mechanism is changing continuously when the thickness of the film reduces gradually. AFM topography images show that the surface of all the films is extremely flat, and there is no sign of any change of the surface morphology as a function of film thickness (see Fig.…”