2023
DOI: 10.1021/acsomega.3c03957
|View full text |Cite
|
Sign up to set email alerts
|

Tailoring Structural, Chemical, and Photocatalytic Properties of ZnO@β-SiC Composites: The Effect of Annealing Temperature and Environment

Abstract: For achieving unified functionalities of rare-earth free materials, the development of innovative zinc oxide and β-silicon carbide (ZnO@β-SiC) composites by a solid-state reaction method is presented. The evolution of zinc silicate (Zn2SiO4) is evidenced by X-ray diffraction when annealed in air beyond 700 °C. Detailed X-ray photoelectron spectroscopy and Fourier transform infrared spectroscopy analyses reveal the involvement of silicon dioxide in forming Zn2SiO4. Transmission electron microscopy and the assoc… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
5

Citation Types

1
5
0

Year Published

2024
2024
2024
2024

Publication Types

Select...
5

Relationship

1
4

Authors

Journals

citations
Cited by 7 publications
(6 citation statements)
references
References 77 publications
1
5
0
Order By: Relevance
“…On the other side, the 560 nm peak is found to be slightly blue-shifted after annealing at 1200 °C and remained unchanged up to 1400 °C. Furthermore, the amount of ZnO was previously shown to be reduced significantly in ZS-12A by subsequent formation of Zn 2 SiO 4 at the ZnO/β-SiC interface due to strong chemical reaction of ZnO with SiO 2 . A similar green emission was also reported for a ZnO/porous Si system due to the formation of V O at the interface. , …”
Section: Resultssupporting
confidence: 56%
See 4 more Smart Citations
“…On the other side, the 560 nm peak is found to be slightly blue-shifted after annealing at 1200 °C and remained unchanged up to 1400 °C. Furthermore, the amount of ZnO was previously shown to be reduced significantly in ZS-12A by subsequent formation of Zn 2 SiO 4 at the ZnO/β-SiC interface due to strong chemical reaction of ZnO with SiO 2 . A similar green emission was also reported for a ZnO/porous Si system due to the formation of V O at the interface. , …”
Section: Resultssupporting
confidence: 56%
“…Such an intriguing dual emission at ∼560 and 740 nm has never been reported before to the best of our knowledge. One can also find the suppression of the near band edge emission of ZnO (∼380 nm) with the evolution of a relatively weak peak at ∼420 nm, which can be attributed to the formation of defects like SiO related species , due to the formation of SiO 2 by surface oxidation of β-SiC after a heat treatment at 1100 °C. In addition to defects such as SiO-related species, nonbridging oxygen-hole centers (NBOHC) (O 3 Si–O°) have also been suggested to arise during the surface oxidation of β-SiC.…”
Section: Resultsmentioning
confidence: 90%
See 3 more Smart Citations