Tandem GCIB-ToF-SIMS and GCIB-XPS analyses of the 2-mercaptobenzothiazole on brass

Abstract

Surface analysis of 2-mercaptobenzothiazole (MBTH) adsorbed on brass from 3 wt.% NaCl solution was performed by means of X-ray photoelectron spectroscopy and tandem (MS/MS) time-of-flight secondary ion mass spectrometry (ToF-SIMS). These surface analytical techniques were used in association with the gas cluster ion beam (GCIB) sputtering method at various acceleration energies and cluster sizes, which slowly removes the surface layer and leaves the chemical information intact during the sputtering of the very thin surface layer. In addition, MS1 ToF-SIMS was used for 2D and 3D imaging to show the molecular and elemental distribution of the surface species. Using the tandem ToF-SIMS capability, the MS2 spectra clearly confirmed the presence of MBTH on the surface. Moreover, organometallic complexes were indicated, which formed between the MBTH and Cu ions released due to the corrosion of the brass. These analyses were performed based on the fragmentation products identified in the MS2 spectra.

XPS depth profiling of functional materials: applications of ion beam etching techniques

“…(2) In GCIB etching, the sputtering rate of a cluster ion beam for different materials is still unknown and needs a lot of experimental data. 89 (3) An ideal surface for XPS analyses should be flat, but etching a flat surface layer remains a challenge for both MAIB and GCIB modes. With regard to the potential of ion etching techniques in XPS depth profiling, past works have revealed the wonderful prospect of the MAIB and GCIB techniques applied in the field of the material analysis.…”

“…These results attested that the GCIB technique could be used as an efficient metrology for profiling film and layer-like materials. Besides, XPS depth profiling of 2-mercaptobenzothiazole adsorbed on brass 89 and an organic stabiliser in inkjet-printed silver nanoparticles, 90 was also performed using an XPS technique in association with the GCIB method at different acceleration energies and cluster sizes.…”

Atomic spectrometry update: review of advances in the analysis of metals, chemicals and materials

“…No signicant difference was found in the pre-and postdischarge Pb ratios meaning that any differences in Pb ratios was due to the ammunition rather than the heat and pressure of the discharge. The 206 Pb/ 204 Pb ranged from 17.36 to 20.31, 207 Pb/ 204 Pb ranged from 15.53 to 15.78 and 208 Pb/ 204 Pb ratios ranged from 37.24 to 39.19. Multivariate likelihood ratios were then calculated and led to a low rate of misleading evidence (<0.53%).…”

“…An example, by Finsgar, reported the analysis of the surface of a film of 2-mercaptobenzothiazole formed on brass by immersing it in a 3% sodium chloride solution containing 100 mg L −1 of the compound. 208 The two techniques of gas cluster ion beam (GCIB)-TOF-SIMS and GCIB-XPS were used for the analysis. The operating parameters were optimised, i.e.…”

“…304 This is because the abundance of Pb isotopes in primer components of lead styphnate varies signicantly. Forty-four samples were characterised from their isotope ratios of 206 Pb/ 204 Pb, 207 Pb/ 204 Pb, and 208 Pb/ 204 Pb using LA-multicollector-ICP-MS.…”