2023
DOI: 10.1016/j.jaerosci.2023.106230
|View full text |Cite
|
Sign up to set email alerts
|

Technical note: Characterization of polystyrene latex spheres 300 nm in diameter with a singularly narrow size distribution

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3

Citation Types

0
3
0

Year Published

2024
2024
2024
2024

Publication Types

Select...
2
1

Relationship

1
2

Authors

Journals

citations
Cited by 3 publications
(3 citation statements)
references
References 11 publications
0
3
0
Order By: Relevance
“…12−15 As with DLS and SAXs, DMA analysis is also an ensemble-based measurement, but unlike DLS and SAXS, DMA can separate and distinguish multiple nanoparticle geometries and distinct size distributions present in a single sample with uncertainties as low as ∼1% of the nominal particle diameters. 14,15 Images provided by different types of electron microscopies and AFM make it possible to obtain information about the distribution of particle sizes and shapes from multiple individual particle measurements. 8−11 Single particle methods are powerful tools to characterize nanoparticles, but challenges associated with cost, sample preparation, and often labor-intensive image analysis can sometimes preclude the use of these microscopy techniques in obtaining robust sampling statistics.…”
Section: Introductionmentioning
confidence: 99%
See 2 more Smart Citations
“…12−15 As with DLS and SAXs, DMA analysis is also an ensemble-based measurement, but unlike DLS and SAXS, DMA can separate and distinguish multiple nanoparticle geometries and distinct size distributions present in a single sample with uncertainties as low as ∼1% of the nominal particle diameters. 14,15 Images provided by different types of electron microscopies and AFM make it possible to obtain information about the distribution of particle sizes and shapes from multiple individual particle measurements. 8−11 Single particle methods are powerful tools to characterize nanoparticles, but challenges associated with cost, sample preparation, and often labor-intensive image analysis can sometimes preclude the use of these microscopy techniques in obtaining robust sampling statistics.…”
Section: Introductionmentioning
confidence: 99%
“…High-resolution DMA measurements obtained by de la Mora and co-workers for the same CM nanoparticles yielded an upper bound for the mean diameter at ∼100 nm and fwhm of 3%, consistent with these TEM results. 14 The higher mean diameter estimated by DMA may be due to the retention of involatile solutes and unevaporated solvent in the ESI process used to generate gas-phase nanoparticles or due to uncertainties in the DMA calibration and flow rates 14 or particle shrinkage in TEM measurements. The Nanospheres have a manufacturer certified, NISTtraceable mean diameter of 101 ± 3 nm, which is also consistent with the observed range of TEM mean diameters.…”
Section: Introductionmentioning
confidence: 99%
See 1 more Smart Citation