2011 IEEE 23rd International Symposium on Power Semiconductor Devices and ICs 2011
DOI: 10.1109/ispsd.2011.5890823
|View full text |Cite
|
Sign up to set email alerts
|

Techniques to prevent substrate injection induced failure during ESD events in automotive applications

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
0
0

Year Published

2015
2015
2018
2018

Publication Types

Select...
1
1
1

Relationship

0
3

Authors

Journals

citations
Cited by 3 publications
references
References 6 publications
0
0
0
Order By: Relevance