Technologies for Creating Adaptive Testing: Advantage, Algorithm and Application

Ashirova, Anorgul I.; Allaberganova, Muyassar R.; Bekchanov, Bekchan Y.

doi:10.1109/apeie59731.2023.10347832

2023 IEEE XVI International Scientific and Technical Conference Actual Problems of Electronic Instrument Engineering (APEIE) 2023

DOI: 10.1109/apeie59731.2023.10347832

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Technologies for Creating Adaptive Testing: Advantage, Algorithm and Application

Anorgul I. Ashirova,

Muyassar R. Allaberganova,

Bekchan Y. Bekchanov

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Technologies for Creating Adaptive Testing: Advantage, Algorithm and Application

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