“…Based on the previous sedimentary thickness contour map (Luo, 1998;Zhang et al, 2012), additional data were provided: the resampled thickness from the new industry seismic profiles and the deep seismic reflection profiles (Burchfiel et al, 1995;Hubbard et al, 2009;Hubbard et al, 2010;Jia et al, 2010;Li et al, 2013;Liu et al, 2012;Lu et al, 2012;Plesch et al, 2007;Wang et al, 2013b;Yan et al, 2009;Yan et al, 2003;Zhou et al, 2013). The thickness was translated from two-way time in accordance with different crustal velocity in different regions, and then we used the Kriging method to interpolate the thickness to form the thickness grid, and then create the sedimentary thickness map with higher resolution contour line.…”