TEM imaging and evalution of magnetic structures in Co/Cu multilayers

Zweck, Josef; Zimmermann, Tanja; Schuhrke, T.

doi:10.1016/s0304-3991(96)00107-6

Cited by 16 publications

(7 citation statements)

References 12 publications

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“…The circle pattern observed for t Ir ϭ0.5 nm suggests that in this strongly AF coupled multilayer 360°domain walls exist and that these domain walls lie one on top of the other, as discussed in Ref. 21. The MFM image obtained from the thinnest multilayer reveals a weak line pattern with a linewidth of about 0.3 m and a distance of 2-5 m, as shown in Fig.…”

Section: Resultssupporting

confidence: 64%

Structural, magnetotransport, and micromagnetic properties of sputtered Ir(111)/Co superlattices

Luo

Pfeifer

Kaeufler

et al. 2000

Journal of Applied Physics

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Section: Resultssupporting

confidence: 64%

Structural, magnetotransport, and micromagnetic properties of sputtered Ir(111)/Co superlattices

Luo

Pfeifer

Kaeufler

et al. 2000

Journal of Applied Physics

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“…For magnetoelectronic and spintronic device applications, the domain state and switching behavior of various vertically and laterally structured magnetic systems requires detailed investigations in the space and time domain. The experimental techniques available for domain imaging provide either real space information, such as magnetic force microscopy (MFM) [1,2], Kerr microscopy (KM) [3], Lorentz microscopy (LM) [4,5,6], polarized electron emission microscopy (PEEM) [7,8], and secondary electron microscopy with polarization analysis (SEMPA) [9], or reciprocal space information, such as resonant soft xray magnetic small-angle scattering (SAS) [10]. In any case, magnetic domain information is obtained via magnetic stray fields emanating from the sample (MFM) or via the local magnetic polarization.…”

Section: Introductionmentioning

confidence: 99%

Magnetic induction and domain walls in magnetic thin films at remanence

Radu

Leiner

Westerholt

et al. 2005

J. Phys.: Condens. Matter

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Magnetic domain walls in thin films can be well analyzed using polarized neutron reflectometry. Well defined streaks in the off-specular spin-flip scattering maps are explained by neutron refraction at perpendicular Néel walls. The position of the streaks depends only on the magnetic induction within the domains, whereas the intensity of the off-specular magnetic scattering depends on the spin-flip probability at the domain walls and on the average size of the magnetic domains. This effect is fundamentally different and has to be clearly distinguished from diffuse scattering originating from the size distribution of magnetic domains. Polarized neutron reflectivity experiments were carried out using a 3 He gas spin-filter with a analyzing power as high as 96% and a neutron transmission of approx 35%. Furthermore, the off-specular magnetic scattering was enhanced by using neutron resonance and neutron standing wave techniques.

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“…In both fields, differential phase contrast (DPC) experiments 6 7 8 are considered as a key for the understanding of tunnelling electroresistance 9 and the quantum-confined Stark effect 10 , respectively. On the basis of its success in the quantification of magnetic fields 11 12 13 varying on the micrometre scale, conventional DPC is predicted to be able to map atomic electric fields at the picometre scale by aberration-corrected scanning transmission electron microscopy (STEM), and prospects to detect electron redistributions due to chemical bonding have been given 6 . Recently, impressive DPC experiments have been performed in which signatures of atomic electric fields, including ionicity, have been observed 8 by recording portions of diffraction patterns on a segmented annular bright-field detector 14 15 16 .…”

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confidence: 99%

Atomic electric fields revealed by a quantum mechanical approach to electron picodiffraction

et al. 2014

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By focusing electrons on probes with a diameter of 50 pm, aberration-corrected scanning transmission electron microscopy (STEM) is currently crossing the border to probing subatomic details. A major challenge is the measurement of atomic electric fields using differential phase contrast (DPC) microscopy, traditionally exploiting the concept of a field-induced shift of diffraction patterns. Here we present a simplified quantum theoretical interpretation of DPC. This enables us to calculate the momentum transferred to the STEM probe from diffracted intensities recorded on a pixel array instead of conventional segmented bright-field detectors. The methodical development yielding atomic electric field, charge and electron density is performed using simulations for binary GaN as an ideal model system. We then present a detailed experimental study of SrTiO3 yielding atomic electric fields, validated by comprehensive simulations. With this interpretation and upgraded instrumentation, STEM is capable of quantifying atomic electric fields and high-contrast imaging of light atoms.

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TEM imaging and evalution of magnetic structures in Co/Cu multilayers

Cited by 16 publications

References 12 publications

Structural, magnetotransport, and micromagnetic properties of sputtered Ir(111)/Co superlattices

Structural, magnetotransport, and micromagnetic properties of sputtered Ir(111)/Co superlattices

Magnetic induction and domain walls in magnetic thin films at remanence

Atomic electric fields revealed by a quantum mechanical approach to electron picodiffraction

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