2007
DOI: 10.1007/s10853-007-1592-z
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TEM microstructural analysis of As-Bonded Al–Au wire-bonds

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Cited by 38 publications
(22 citation statements)
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“…These flaws, which are known as solidification voids, and are formed inside the intermetallic region, are the result of the volume changes upon the formation of the Al-Au intermetallic. Karpel et al [27] also noted that increasing the silicon die temperature increased the shear strength of the ball bond as a result of further intermetallic compound formation. Figure 16 shows the relationship between shear strength and silicon die temperature obtained by Karpel et al [27].…”
Section: Transmission Electron Microscopy (Tem) Analysismentioning
confidence: 98%
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“…These flaws, which are known as solidification voids, and are formed inside the intermetallic region, are the result of the volume changes upon the formation of the Al-Au intermetallic. Karpel et al [27] also noted that increasing the silicon die temperature increased the shear strength of the ball bond as a result of further intermetallic compound formation. Figure 16 shows the relationship between shear strength and silicon die temperature obtained by Karpel et al [27].…”
Section: Transmission Electron Microscopy (Tem) Analysismentioning
confidence: 98%
“…Karpel et al [27] also noted that increasing the silicon die temperature increased the shear strength of the ball bond as a result of further intermetallic compound formation. Figure 16 shows the relationship between shear strength and silicon die temperature obtained by Karpel et al [27]. Ji et al [28] used high-resolution transmission electron microscopy (HRTEM) to analyse the Au wire bonding mechanism.…”
Section: Transmission Electron Microscopy (Tem) Analysismentioning
confidence: 98%
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