Temperature and Process Calibration of HBT-Based Square-Law Power Detectors for Millimeter-Wave Built-In Self-Test

Wenger, Y.; Meinerzhagen, B.; Issakov, Vadim

doi:10.1109/ims37964.2023.10188175

2023 IEEE/MTT-S International Microwave Symposium - IMS 2023 2023

DOI: 10.1109/ims37964.2023.10188175

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Temperature and Process Calibration of HBT-Based Square-Law Power Detectors for Millimeter-Wave Built-In Self-Test

Y. Wenger

B. Meinerzhagen

Vadim Issakov

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2024

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Cited by 2 publications

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Built-In Self-Test of Millimeter-Wave Integrated Front-End Circuits: How Far Have We Come?

Wenger,

Meinerzhagen,

Issakov

2024

IEEE Access

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With automotive radar and 5G/6G communications, mass-market applications for millimeterwave circuits in silicon technologies have been identified or established in recent years. For high-volume, millimeter-wave integrated circuits, operating roughly between 30 GHz and 300 GHz, testability is a major concern, both from an overall cost as well as a quality assurance perspective. A solution for cost effective, low-overhead test of millimeter-wave integrated circuits is the integration of built-in self-test (BIST) features into the high-frequency front-end. Because BIST is an emerging topic in high-frequency circuit design, the field is still very fragmented. A plethora of different system concepts as well as building blocks have been proposed in recent years. This paper tries to provide a comprehensive overview of the state of the art in millimeter-wave BIST in an attempt to drive the field towards identification of standardized self-test solutions.INDEX TERMS Built-in self-test, CMOS, millimeter-wave transceivers, SiGe, silicon.

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Built-In Self-Test of Millimeter-Wave Integrated Front-End Circuits: How Far Have We Come?

Wenger,

Meinerzhagen,

Issakov

2024

IEEE Access

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Differential-Mode Power Detection for Built-In Self-Test of SiGe Automotive Radar Transceiver Front Ends

Wenger,

Ng,

Korndörfer

et al. 2024

IEEE Trans. Microwave Theory Techn.

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Recently, the feasibility of differential-mode power detection for built-in self-test (BIST) in millimeter-wave SiGe transceiver front ends has been demonstrated. In this work, a system analysis of typical BIST scenarios is performed. Specifications for the input power levels as well as the accuracy of power detectors are derived from this analysis. A need for at least two different differential detector architectures is identified. Two detectors are derived from the differential power measurement concept, analyzed, and implemented in the 76-81-GHz automotive radar frequency band. They feature a low power consumption of 500 µW and, to the authors' best knowledge, the lowest published circuit areas of approximately 0.005 mm 2 while still being input matched to the differential 100 system impedance. Both these characteristics are essential to keep the overhead of the BIST minimal. With dynamic ranges of 30 dB and up to 46 dB for the two different architectures, the differential power detector concept can achieve sufficient performance for BIST applications. The robustness against process and temperature effects as well as noise is analyzed and reported for both detectors.

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Temperature and Process Calibration of HBT-Based Square-Law Power Detectors for Millimeter-Wave Built-In Self-Test

Cited by 2 publications

References 7 publications

Built-In Self-Test of Millimeter-Wave Integrated Front-End Circuits: How Far Have We Come?

Built-In Self-Test of Millimeter-Wave Integrated Front-End Circuits: How Far Have We Come?

Differential-Mode Power Detection for Built-In Self-Test of SiGe Automotive Radar Transceiver Front Ends

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