2013
DOI: 10.1016/j.infrared.2013.08.007
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Temperature dependence characteristics of dark current for arsenic doped LWIR HgCdTe detectors

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Cited by 15 publications
(7 citation statements)
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“…In order to better understand the dark current mechanisms of the p-on-n MCT diode in this study, the different components of dark current were decomposed. Table 1 summarizes the main contributions of dark current in MCT photodiodes [12][13][14]21]. In the equations, n i is the intrinsic carrier concentration, N a and N d are the acceptor and donor concentration at p and n region, µ n , µ p , τ n and τ p are the minority carrier mobility and lifetime.…”
Section: Resultsmentioning
confidence: 99%
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“…In order to better understand the dark current mechanisms of the p-on-n MCT diode in this study, the different components of dark current were decomposed. Table 1 summarizes the main contributions of dark current in MCT photodiodes [12][13][14]21]. In the equations, n i is the intrinsic carrier concentration, N a and N d are the acceptor and donor concentration at p and n region, µ n , µ p , τ n and τ p are the minority carrier mobility and lifetime.…”
Section: Resultsmentioning
confidence: 99%
“…) exp The characteristic parameters of the p-on-n diode as function of temperature are extracted and plotted in figure 6. It can be seen in figure 6(a) that the donor concentration in the n-type region depends weakly on temperature, which is different with the characteristic of n-on-p MCT diodes [12,13]. In the p-on-n MCT diodes, the n-type doping is achieved by doping indium, while in n-on-p diodes, it is mainly caused by the implantation damages.…”
Section: Dark Current Mechanism Equationsmentioning
confidence: 96%
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“…Thus, it is necessary to make some simplifications. Quan et al [23, 25] and Wang et al [24] have proposed simple approximations to FDI. However, these approximations have only been validated for T = 77–120 K. The HgCdTe device studied in this work operates at T = 200 K. In our case, computations were performed using the Fermi‐Dirac statistics for a non‐degenerate semiconductor model with parabolic energy bands.…”
Section: Simulation Procedures Against Experimental Resultsmentioning
confidence: 99%
“…In this PMWsbased device, the measured dark current is just 2.5 fA at the bias of 1 V, which guarantees the device to operate under very weak optical signals by setting the low noise level of the photodetector. The dark current closely related to the defect state is called trap-assistant-tunnel current and the ultra-low dark current can be attributed to the high crystal quality (text S3) 27 .…”
Section: Introductionmentioning
confidence: 99%