Temperature dependence of resistance and thermopower of thin indium tin oxide films

Lin, Bo-Tsung; Chen, Yi-Fu; Lin, Juhn‐Jong; Wu, Chih-Yuan

doi:10.1016/j.tsf.2010.06.010

Cited by 18 publications

(25 citation statements)

References 27 publications

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“…Note that for much smaller layer thickness below 40 nm, significantly different behaviour has been reported 33 . The observed increase of resistance below about 100 K is also in accordance with measurements of similar ITO films 31,32 and is attributed to effects of weak localisation and electron-electron interaction 31 . The temperature dependence of the resistance is expected to be different when an external magnetic field is applied, this however is a minor effect 32 .…”

Section: Conducting Window Characterizationsupporting

confidence: 88%

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Optically transparent solid electrodes for precision Penning traps

Wiesel

Birkl

Ebrahimi

et al. 2017

Review of Scientific Instruments

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We have conceived, built, and operated a cryogenic Penning trap with an electrically conducting yet optically transparent solid electrode. The trap, dedicated to spectroscopy and imaging of confined particles under large solid angles is of 'half-open' design with one open endcap and one closed endcap that mainly consists of a glass window coated with a highly transparent conductive layer. This arrangement allows for trapping of externally or internally produced particles, yields flexible access for optical excitation and efficient light collection from the trapping region. At the same time, it is electrically closed and ensures long-term ion confinement under well-defined conditions. With its superior surface quality and its high as well as homogeneous optical transmission, the window electrode is an excellent replacement for partially transmissive electrodes that use holes, slits, metallic meshes and the like.

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Section: Conducting Window Characterizationsupporting

confidence: 88%

“…The overall shape of the measured resistance curve follows the Bloch-Grüneisen law, as expected for metallic layers like the present one 31,32 . Note that for much smaller layer thickness below 40 nm, significantly different behaviour has been reported 33 .…”

Section: Conducting Window Characterizationsupporting

confidence: 80%

Optically transparent solid electrodes for precision Penning traps

Wiesel

Birkl

Ebrahimi

et al. 2017

Review of Scientific Instruments

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“…In the case of "homogeneous" ITO thin films, the low-T resistivity increases with decreasing T and can be well explained within the framework of the conventional WL and EEI effects, as previously shown by Ohyama et al, 12,13 and Lin and coworkers. 21,23 On the contrary, in the case of "inhomogeneous" ITO ultrathin films, the low-T conductivity obeys a 1/ρ ∝ ln T law over a wide temperature interval from T * (≈ 2-3 K) up to several tens K, as recently experimentally established by TABLE I. Sample parameters for two series of homogeneous ITO thin films.…”

Section: Resultsmentioning

confidence: 70%

Electron dephasing in homogeneous and inhomogeneous indium tin oxide thin films

Lin

Zhang

et al. 2012

Phys. Rev. B

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The electron dephasing processes in two-dimensional homogeneous and inhomogeneous indium tin oxide thin films have been investigated in a wide temperature range 0.3-90 K. We found that the small-energy-transfer electron-electron (e-e) scattering process dominated the dephasing from a few K to several tens K. At higher temperatures, a crossover to the large-energy-transfer ee scattering process was observed. Below about 1-2 K, the dephasing time τϕ revealed a very weak temperature dependence, which intriguingly scaled approximately with the inverse of the electron diffusion constant D, i.e., τϕ(T ≈ 0.3 K) ∝ 1/D. Theoretical implications of our results are discussed. The reason why the electron-phonon relaxation rate is negligibly weak in this lowcarrier-concentration material is presented.

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“…It appears that Na-doped ITO is a dirty, type II superconductor in the strong-coupling regime. Assuming a Debye temperature h D % 1000 K, 15 we find the effective strong-coupling parameter is…”

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confidence: 96%