Temperature Dependence of the Thermal Expansion Coefficient of (CuInSe2)1—x(2ZnSe)x Solid Solutions

Bodnar, I. V.; Корзун, Б. В.; Chibusova, L. V.

doi:10.1002/(sici)1521-396x(199907)174:1<199::aid-pssa199>3.0.co;2-u

Cited by 9 publications

(1 citation statement)

References 8 publications

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“…The experimental values of room-temperature TEC are in qualitative agreement with literature data (cf. Table 7 for the experimental values [23,[26][27][28][83][84][85][86][87] and Table 8 for the theoretical values [31-33, 88, 89]). The TEC, a a , a c a V , attain their lowest values at about 21 K (the values resulting from the fitting curves are 20.7, 21.8 and 20.5 K, respectively).…”

Section: Thermal Expansionmentioning

confidence: 98%

Thermal expansion of CuInSe2 in the 11–1,073 K range: an X-ray diffraction study

et al. 2013

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Structural and elastic properties of chalcopyritetype CuInSe 2 are determined in almost full stability range of temperature from 11 to 1,073 K, by in situ X-ray diffraction, employing a synchrotron-radiation source. The studied polycrystalline sample was prepared from a stoichiometric single crystal. Phase analysis reveals the formation of a trace amount of indium oxide impurity phase at the highest temperatures studied. From the obtained smooth latticeparameter dependencies on temperature, the temperature dependencies of thermal expansion coefficients are derived. These coefficients are found to follow the trends previously reported for narrow temperature intervals. The present results provide a clear experimental evidence that the linear expansion coefficient is slightly negative below 47 K in both, a and c, directions; this temperature limit is in between the previously reported theoretical value (35 K) and the experimental ones (60 and 80 K) of such limit.

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Section: Thermal Expansionmentioning

confidence: 98%

Thermal expansion of CuInSe2 in the 11–1,073 K range: an X-ray diffraction study

et al. 2013

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A Comparative Study of (Cu-III-Se2)x-(FeSe)1?x Alloys (III: Al, Ga, In) (0 ? x ? 1) by X-Ray Diffraction, Differential Thermal Analysis and Scanning Electron Microscopy

Grima‐Gallardo¹,

Cárdenas²,

Molina³

et al. 2001

phys. stat. sol. (a)

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Polycrystalline samples of (Cu-III-Se 2 )-(FeSe) 1--x alloys (III: Al, Ga and In) were prepared by the usual melting and annealing method in the entire composition range 1 x 0. X-Ray Diffraction (XRD), Differential Thermal Analysis (DTA) and Scanning Electron Microscopy (SEM) techniques were used to characterize the products. From SEM technique, the stoichiometric relation for each sample was checked to be very close to the nominal values, with deviations less than 10%. XRD measurements showed that, for the three alloy families, there is a wide single-phase field, with a chalcopyrite-like structure, for 1x 0.5. The lattice parameters vary linearly with composition and the variation can be predicted using Jaffe and Zunger's model for chalcopyrites, Pauling's set of covalent radii, and the covalent radius of 1.35 A for Fe. From DTA measurements, thermal transitions in the temperature range 300 K < T < 1400 K were obtained. The melting point decreases from that of extreme compounds (x = 0 and x = 1) towards an intersection point (local minimum) at around x = 0.3. These results suggest that under adequate thermal treatments, the single-phase field could be increasing up to around x = 0.3. In a closer analysis, a pronounced local minimum has been observed at x = 2/3 for Ga and In-based alloys, suggesting that the composition x = 2/3 is a new class of compounds, the (Cu-III) 2 FeSe 5 .

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X-Ray Diffraction (XRD), Differential Thermal Analysis (DTA), and Scanning Electron Microscopy (SEM) of (CuInSe2)1?x (VSe)x Alloys (0 ?x ? 0.5)

Gallardo¹,

Durán²,

Quintero³

et al. 2002

phys. stat. sol. (a)

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Temperature Dependence of the Thermal Expansion Coefficient of (CuInSe2)1—x(2ZnSe)x Solid Solutions

Cited by 9 publications

References 8 publications

Thermal expansion of CuInSe2 in the 11–1,073 K range: an X-ray diffraction study

Thermal expansion of CuInSe2 in the 11–1,073 K range: an X-ray diffraction study

A Comparative Study of (Cu-III-Se2)x-(FeSe)1?x Alloys (III: Al, Ga, In) (0 ? x ? 1) by X-Ray Diffraction, Differential Thermal Analysis and Scanning Electron Microscopy

X-Ray Diffraction (XRD), Differential Thermal Analysis (DTA), and Scanning Electron Microscopy (SEM) of (CuInSe2)1?x (VSe)x Alloys (0 ?x ? 0.5)

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