“…The PL efficiency dependences on excitation power density generally exhibit efficiency droop, and are used to evaluate the contribution of Auger recombination [31,33], which is commonly accepted as the main origin of the efficiency droop in InGaN materials [42,43], and has been suggested to be important also in AlGaN [33]. Nevertheless, the Auger processes have also been shown to be affected by carrier localization [5,6,34], while recently, the importance of carrier localization to efficiency droop has reemerged [30,44,45]. This situation motivated us for an attempt to simulate the carrier dynamics in AlGaN by properly describing the influence of carrier localization and without the involvement of the Auger processes.…”