Structural and optical characterization of InAs/InGaAs self-assembled quantum dots grown on (311)B GaAs J. Appl. Phys. 80, 3466 (1996); 10.1063/1.363216 (110) oriented GaAs/Al0.3Ga0.7As quantum wells for optimized T-shaped quantum wires Appl. Phys. Lett. 69, 800 (1996) Effects of anodic oxide induced intermixing on the structural and optical properties of stacked GaAs quantum wire ͑QWR͒ structures grown on a sawtooth-type nonplanar GaAs substrate are investigated. Cross-sectional transmission electron microscope ͑XTEM͒ observation, temperature dependent photoluminescence ͑PL͒ and cathodoluminescence ͑CL͒ imaging were used. Intermixing was achieved by pulsed anodic oxidation of the GaAs cap layer and subsequent rapid thermal annealing, was verified by XTEM analysis. A significant enhancement of QWR PL is observed accompanied by a notable blueshift of the sidewall quantum well ͑SQWL͒ PL due to the intermixing. Furthermore, an extended necking region is observed after the intermixing by spatially resolved CL. The temperature dependence of the PL intensities of both SQWL and QWR show maxima at approximately Tϳ110 K indicating the role of the extended necking region in feeding carriers to SQWL and QWR.