Temperature-dependent spectral generalized magneto-optical ellipsometry

Abstract

We present a setup for temperature-dependent spectral generalized magneto-optical ellipsometry (SGME). This technique gives access to the electronic as well as the magnetic properties of ferromagnetic materials within one single magneto-optical measurement. It also allows the determination of the orientation of the magnetization. We show spectra of the real and the imaginary part of the refractive index N as well as the magneto-optical coupling parameter Q of permalloy and iron films for in-plane magnetization. Our findings demonstrate the relevance of SGME for the understanding of the interplay between electronic and magnetic properties of ferromagnetics.

Magneto-optical investigation of spin polarisation of and

“…SGME is an optical technique that allows to determine the energy dependence of e xx and e xy independently within one single reflection measurement. The ferromagnetic sample is subject to an external magnetic fieldB ext of high homogeneity inducing an inplane saturation magnetisationM S : The relative change of the polarisation of the reflected light upon magnetisation reversal is measured without any a priori knowledge of the magnetisation direction f with respect to the plane of incidence [5,6].…”

Temperature dependence of ellipsometric spectra of Fe and CrNiAl steel

“…Contrary to the assumption of Ref. [5], the Drude term is negligible in the absorptive part ε 2 throughout our spectral range. In fact, the free carriers dominate the absorption at very low photon energies, and the values E p =3.66 eV and Γ=19.3 meV were obtained from nonresonant cavity measurements below the photon energy of 12 meV [8].…”

“…The ellipsometric data of Refs. [5] (sputtered film) and [6] (single crystal) differ significantly, both in the modulus of ε and the magnitude of the prominent band around 2.5 eV (note that the latter is best seen as the s-like structure in the real part). The results of reflectance and transmittance on evaporated films of variable thickness [7] show a slight signature of an inconsistency between the real and imaginary parts of ε, as the 2.5 eV band is reasonably resolved in ε 2 but hardly traceable in ε 1 .…”

Magneto-ellipsometry as a powerful technique for investigating magneto-optical structures properties

“…There are many papers on magneto-optical ellipsometry, however they mostly present the ex situ investigations [2,3,4,5], while our paper offers the solution of the problem of the in situ investigations by means of magneto-ellipsometry.…”