2011
DOI: 10.1063/1.3556617
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Terahertz optical-Hall effect characterization of two-dimensional electron gas properties in AlGaN/GaN high electron mobility transistor structures

Abstract: Schöche, S.; Shi, Junxia; Boosalis, A.; Kühne, P.; Herzinger, C. M.; Woollam, John A.; Schaff, W. J.; Eastman, L. F.; Schubert, M.; and Hofmann, Tino, "Terahertz optical-Hall effect characterization of two-dimensional electron gas properties in AlGaN/GaN high electron mobility transistor structures" (2011). Faculty Publications from the Department of Electrical and Computer Engineering. 224.

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Cited by 27 publications
(21 citation statements)
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“…In order to derive the free charge carrier density and mobility parameters from the plasma frequency and broadening parameters one needs the effective mass parameters. Unless magnetic fields are exploited and the optical Hall effect can be measured [93,[95][96][97][98][99][100][101], long-wavelength ellipsometry requires these parameters from auxiliary investigations.…”
Section: -11mentioning
confidence: 99%
“…In order to derive the free charge carrier density and mobility parameters from the plasma frequency and broadening parameters one needs the effective mass parameters. Unless magnetic fields are exploited and the optical Hall effect can be measured [93,[95][96][97][98][99][100][101], long-wavelength ellipsometry requires these parameters from auxiliary investigations.…”
Section: -11mentioning
confidence: 99%
“…22,[25][26][27][28] Later, OHE experiments were conducted in the terahertz (THz) spectral range, 29 but were limited to room temperature and low magnetic fields (B ≤ 1.8 T). [30][31][32][33] Since the magnitude of the OHE depends on the magnetic field strength, higher magnetic fields facilitate the detection of the OHE. Furthermore, the sensitivity to the OHE is greatly enhanced by phonon mode coupling, 34,35 surface guided waves 27 and Fabry-Pérot interferences.…”
Section: Introductionmentioning
confidence: 99%
“…In general, this birefringence leads to polarization mode coupling which is conveniently detected by generalized ellipsometry at oblique angle of incidence and at terahertz (THz) frequencies, for example. THz-OHE has recently been demonstrated as non-contact and therefore valuable tool for the investigation of free charge carrier properties in semiconductor heterostructures [2][3][4][5][6][7][8][9]. Previous instrumental approaches, discussed more detailed in Refs.…”
mentioning
confidence: 99%
“…The experimental MIR-SE and THz-OHE data sets were analyzed simultaneously using an optical model composed of eight phases including a AlInN top layer/2DEG/AlN spacer/GaN buffer/Al 2 O 3 substrate/air gap/Ni cavity surface [7]. Nonlinear regression methods where used to match the lineshape of experimental and optical model calculated data as close as possible by varying relevant model parameters using parameterized model dielectric functions [13].…”
mentioning
confidence: 99%