Terminal area navigation using relative GPS bias states with a terrain scene

Krempasky, Jerome J.

doi:10.2514/6.1997-3562

Cited by 3 publications

(3 citation statements)

References 2 publications

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“…This might have important consequences for other experimental techniques probing mainly the surface such as x-ray photoelectron spectroscopy, and helps to explain angleresolved photoemission data on this system. 46…”

Section: F Bandwidthmentioning

confidence: 99%

Structure determination of monolayer-by-monolayer grownLa1−xSrxMnO3thin films and the onset of magnetoresistance

et al. 2008

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Surface x-ray diffraction was used to determine the atomic structures of La 1−x Sr x MnO 3 thin films, grown monolayer by monolayer on SrTiO 3 by pulsed laser deposition. Structures for one-, two-, three-, four-, six-, and nine-monolayer-thick films were solved using the Coherent Bragg rod analysis phase-retrieval method and subsequent structural refinement. Four important results were found. First, the out-of-plane lattice constant is elongated across the substrate-film interface. Second, the transition from substrate to film is not abrupt, but proceeds gradually over approximately three unit cells. Third, Sr segregates towards the topmost monolayer of the film: we determined a Sr-segregation enthalpy of −15 kJ/ mol from the occupation parameters. Finally, the electronic bandwidth W was used to explain the onset of magnetoresistance for films of nine or more monolayers thickness. Resistivity measurements of the nine monolayer-thick film confirm magnetoresistance and the presence of a dead layer with mostly insulating properties.

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Section: F Bandwidthmentioning

confidence: 99%

Structure determination of monolayer-by-monolayer grownLa1−xSrxMnO3thin films and the onset of magnetoresistance

et al. 2008

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“…Here we have a magnetic moment per unit length of Using textbooks of electro-technique the magnetic field component in z-direction at the position (x, z) created by the magnetization currents in the tape was calculated [7].…”

Section: Calculation Of the Ratio Magnetic Flux To Magnetic Moment Fomentioning

confidence: 99%

Ac-loss measurement of coated conductors: The influence of the pick-up coil position

Schmidt

2008

Physica C: Superconductivity and its Applications

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“…This method has been applied to study the long term stability of the photon beam as measured in the frontend of the I19 beamline at DLS using EBPMs and XBPMs. These XBPMs are of the tungsten vane type and measure DC current caused by photo emission and have been installed at various facilities to complement the measurements of the EBPMs [11,12,13]. In this particular straight a slow feedback (1 s update rate) on the position reading from the second XBPM corrects for any angular drifts by putting offsets on the upstream and downstream EBPM demand values, which effectively steers the beam always to a fixed position in this XBPM by the corrections of the FOFB [14].…”

Section: Long Term Stability and Xbpm Feedbackmentioning

confidence: 99%

Achieving and Measuring Sub-Micrometer Beam Stability at 3rd Generation Light Sources

Rehm¹

2013

J. Phys.: Conf. Ser.

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Abstract.Electron beam stability at the source points of synchrotron radiation is an accepted requirement for the preservation of the low emittance provided in 3rd generation light sources. With emittances approaching 1nm rad this typically requires sub micrometer positional stability at the source point over time scales from milliseconds to at least hours and ideally much longer. These challenges are routinely met by the use of fast orbit feedback systems. This contribution sets out to first establish a relevant representation of stability over many orders of magnitude in time and looks at available stable references. To complement this, data on the electron and X-ray beam stability achieved at various operational light sources is compared.

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Terminal area navigation using relative GPS bias states with a terrain scene

Cited by 3 publications

References 2 publications

Structure determination of monolayer-by-monolayer grownLa1−xSrxMnO3thin films and the onset of magnetoresistance

Structure determination of monolayer-by-monolayer grownLa1−xSrxMnO3thin films and the onset of magnetoresistance

Ac-loss measurement of coated conductors: The influence of the pick-up coil position

Achieving and Measuring Sub-Micrometer Beam Stability at 3rd Generation Light Sources

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