2018
DOI: 10.1109/les.2017.2754446
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Test and Reliability Challenges for Approximate Circuitry

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Cited by 6 publications
(4 citation statements)
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“…Studies focusing on the reliability of ACC are few. A number of scholars [22,23] have emphasized the necessity of reliability analysis for ACCs, but their research is not extensive. Reference [24] selected an error-tolerant application, i.e., H.264/AVC decoder, to evaluate fault criticality in different modules and in the same modules.…”
Section: Related Workmentioning
confidence: 99%
“…Studies focusing on the reliability of ACC are few. A number of scholars [22,23] have emphasized the necessity of reliability analysis for ACCs, but their research is not extensive. Reference [24] selected an error-tolerant application, i.e., H.264/AVC decoder, to evaluate fault criticality in different modules and in the same modules.…”
Section: Related Workmentioning
confidence: 99%
“…The threshold testing [122] was proposed in order to increase the production yield of conventional circuits (i.e., nonapproximate circuits). A similar approach was adopted by Sindia et al [123] to functionally classify conventional ICs [116].…”
Section: A Axa Testing Principlesmentioning
confidence: 99%
“…By solving the SAT problem, one can prove whether the input vector i exists or not. Both the mentioned techniques formally prove whether the vector i exists or not [116]. Concerning the full adder example, the vector i exists for five out of ten faults, classified as non-redundant according to WCE metric.…”
Section: B Sct-metric-aware Fault Classificationmentioning
confidence: 99%
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