2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits &Amp; Systems (DDECS) 2012
DOI: 10.1109/ddecs.2012.6219084
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Test platform for fault tolerant systems design properties verification

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Cited by 3 publications
(2 citation statements)
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“…This parameter depends on the environment. The value 100 in the equation is the average number of bits that had an effect on the correct function of one LUT in the design tested in [26]. This number is computed as the fraction between all bits that affected the design and the number of LUT in the design.…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…This parameter depends on the environment. The value 100 in the equation is the average number of bits that had an effect on the correct function of one LUT in the design tested in [26]. This number is computed as the fraction between all bits that affected the design and the number of LUT in the design.…”
Section: Resultsmentioning
confidence: 99%
“…However, the actual number depends on the type of the implemented system and even on the setting of place and route tools. Therefore, we used the experiments done in [26] to compute the number of bits that will affect the correct behaviour of a simple system.…”
Section: Resultsmentioning
confidence: 99%