Test program generation for mixed-signal integrated circuits based on automata network

Abstract

Testing and diagnosis of mixed-signal integrated circuits are very important and complex tasks, which require selection the most relevant test methods for analog and digital subcircuits and subsequent their matching for comprehensive testing of a circuit on the whole. Two basic models for description the test process of mixed-signal IC based on the algebraic automata theory are proposed. The method of test program generation for mixed-signal IC in the form of automata network is presented in the paper. Generated test programs take into account the features of CUT and used test equipment and also ensure matching of applied test methods for hierarchical testing of mixed-signal IC. The method provides the feasibility to the automated test program generation for mixed-signal IC testing with various resolving ability using the state-of-the-art ATE. Experimental results of the method application for the mixed-signal circuit are presented.