“…The main advantage is that the same control structure can be used for all tests in the session, which minimizes the routing of control wires. In general, (6,2) t 4 (4,2) t 2 (3,5) t 3 (4,2) test (power,time) power limit = 10 systems are not tested with a BIST structure only for each testable unit and therefore a TAM is required [6,7,8,24]. Chakrabarty proposed an integer linear programming (ILP) for the allocation of TAM width [6,7,8] and the effect on test time for systems using various design styles for test access with the TestShell wrapper is analysed by Aertes and Marinissen [1].…”