2017 International Conference of Microelectronic Test Structures (ICMTS) 2017
DOI: 10.1109/icmts.2017.7954288
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Test structure configurations for analysis of field effect influenced self-heating and thermal coupling in High Voltage SiGe HBTs

Breandan O hAnnaidh
1
,
Edward Coyne
2
,
Bill Lane
3
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