Test structure to determine tip sharpness of micromechanical probes of scanning force microscopy

Белов, А. Н.; Гаврилов, С. А.; Sagunova, I. V.; Tikhomirov, A. A.; Chaplygin, Yu. A.; Shevyakov, V. I.

doi:10.1134/s1995078010050125

Cited by 7 publications

(4 citation statements)

References 6 publications

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“…In [14] similar analysis gave the estimate of the radius of the dimples walls cross-sections of 1-2nm for their sample of the dimpled aluminium. Taking into account of our SEM and AFM images we arrived at the same estimate for the peaks of our sample.…”

Section: Experimental Methodsmentioning

confidence: 93%

“…It's shown that carefully selecting anodization parameters a set of alumina peaks with radius at apexes of about 10nm can be obtained. As the interface between the alumina and aluminium has a developed structure, the surface of aluminium after selective alumina removal (the dimpled aluminium) is shown to be a suitable test-structure for tip shape characterization [14].…”

Section: Introductionmentioning

confidence: 99%

See 1 more Smart Citation

Simple and reliable method of conductive SPM probe fabrication using carbon nanotubes

Dremov,

Fedoseev,

Fedorov

et al. 2014

Preprint

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We demonstrate the procedure of Scanning Probe Microscopy (SPM) conductive probe fabrication with a single multi-walled carbon nanotube (MWNT) on a silicon cantilever pyramid. The nanotube bundle reliably attached to the metal-covered pyramid is formed using electrophoresis technique from the MWNT suspension. It's shown that the dimpled aluminium sample can be used both for shortening/modification of the nanotube bundle by applying pulse voltage between the probe and the sample, and for controlling the probe shape via Atomic Force Microscopy (AFM) imaging the sample. It allows to fabricate a probe suitable for SPM imaging in the contact and modulation regimes. The majority of such probes are conductive with conductivity not degrading within hours of SPM imaging.

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Section: Experimental Methodsmentioning

confidence: 93%

Section: Introductionmentioning

confidence: 99%

Simple and reliable method of conductive SPM probe fabrication using carbon nanotubes

Dremov,

Fedoseev,

Fedorov

et al. 2014

Preprint

View full text Add to dashboard Cite

show abstract

“…To test the efficiency of the obtained probe, we scanned the surface of electrochemically structured (dimpled) aluminum. Such samples are often used to demonstrate probe quality, since they have thin walls and sharp protrusions at the vertices of hexagons 13,47 . A spike was grown on a tip coated with platinum (though, as already noted, the presence of a metal is not necessary, an uncoated tip can be used just as well).…”

Section: Manufacturing Sharp Probes In-situmentioning

confidence: 99%

Fabrication of sharp atomic force microscope probes using in situ local electric field induced deposition under ambient conditions

Temiryazev

Bozhko

Robinson³

et al. 2016

Review of Scientific Instruments

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We demonstrate a simple method to significantly improve the sharpness of standard silicon probes for an atomic force microscope or to repair a damaged probe. The method is based on creating and maintaining a strong, spatially localized electric field in the air gap between the probe tip and the surface of conductive sample. Under these conditions, nanostructure growth takes place on both the sample and the tip. The most likely mechanism is the decomposition of atmospheric adsorbate with subsequent deposition of carbon structures. This makes it possible to grow a spike of a few hundred nanometers in length on the tip. We further demonstrate that probes obtained by this method can be used for high-resolution scanning. It is important to note that all process operations are carried out in situ, in air and do not require the use of closed chambers or any additional equipment beyond the atomic force microscope itself.

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“…As the interface between the alumina and aluminum has a developed structure, the surface of aluminum after selective alumina removal (the dimpled aluminum) is shown to be a suitable test-structure for tip shape characterization. 13 The radius of peaks on the surface was estimated to be 1-2 nm.…”

Section: Introductionmentioning

confidence: 99%

Fast and reliable method of conductive carbon nanotube-probe fabrication for scanning probe microscopy

Dremov

Fedoseev

Fedorov

et al. 2015

Review of Scientific Instruments

View full text Add to dashboard Cite

We demonstrate the procedure of scanning probe microscopy (SPM) conductive probe fabrication with a single multi-walled carbon nanotube (MWNT) on a silicon cantilever pyramid. The nanotube bundle reliably attached to the metal-covered pyramid is formed using dielectrophoresis technique from the MWNT suspension. It is shown that the dimpled aluminum sample can be used both for shortening/modification of the nanotube bundle by applying pulse voltage between the probe and the sample and for controlling the probe shape via atomic force microscopy imaging the sample. Carbon nanotube attached to cantilever covered with noble metal is suitable for SPM imaging in such modulation regimes as capacitance contrast microscopy, Kelvin probe microscopy, and scanning gate microscopy. The majority of such probes are conductive with conductivity not degrading within hours of SPM imaging.

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Test structure to determine tip sharpness of micromechanical probes of scanning force microscopy

Cited by 7 publications

References 6 publications

Simple and reliable method of conductive SPM probe fabrication using carbon nanotubes

Simple and reliable method of conductive SPM probe fabrication using carbon nanotubes

Fabrication of sharp atomic force microscope probes using in situ local electric field induced deposition under ambient conditions

Fast and reliable method of conductive carbon nanotube-probe fabrication for scanning probe microscopy

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