Testing Embedded Toggle Pattern Generation Through On-Chip IR Drop Monitoring

Monta, Kazuki; Kataselas, Leonidas; Fodor, Ferenc; Hatzopoulos, A.A.; Nagata, Makoto; Marinissen, Erik Jan

doi:10.1109/ets50041.2021.9465391

Cited by 3 publications

(1 citation statement)

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“…The evolution of Q DD (t i ) in the successive time sections for t i (i = 0, 1, 2, ...) reflects the chronological sequences of toggle types Figure 1. (a) SoC VLSI chip with multiple power domains includes ePTG and OCM for power supply diagnosis [12] and (b) a zoom-in of the OCM circuitry [12].…”

Section: Dynamic Ps Monitoring and Analysis Principlesmentioning

confidence: 99%

Testing Embedded Toggle Generation Through On-Chip IR-Drop Measurements

et al. 2022

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Section: Dynamic Ps Monitoring and Analysis Principlesmentioning

confidence: 99%