2015
DOI: 10.3390/cryst5010143
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TEV—A Program for the Determination of the Thermal Expansion Tensor from Diffraction Data

Abstract: TEV (Thermal Expansion Visualizing) is a user-friendly program for the calculation of the thermal expansion tensor αij from diffraction data. Unit cell parameters determined from temperature dependent data collections can be provided as input. An intuitive graphical user interface enables fitting of the evolution of individual lattice parameters to polynomials up to fifth order. Alternatively, polynomial representations obtained from other fitting programs or from the literature can be entered. The polynomials… Show more

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Cited by 69 publications
(44 citation statements)
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“…The quality of the fitting can be described numerically by the coefficient of determination R 2 : where a i is the observed value for component i, âthe calculated value for component i, a ̅ i the mean, and n the number of different temperatures. 20 The thermal expansion of a monoclinic crystal can be expressed by a second rank tensor of the form where α 13 = α 31 . This tensor refers to an orthogonalized coordinate system {e 1 , e 2 , e 3 }.…”
Section: Methodsmentioning
confidence: 99%
“…The quality of the fitting can be described numerically by the coefficient of determination R 2 : where a i is the observed value for component i, âthe calculated value for component i, a ̅ i the mean, and n the number of different temperatures. 20 The thermal expansion of a monoclinic crystal can be expressed by a second rank tensor of the form where α 13 = α 31 . This tensor refers to an orthogonalized coordinate system {e 1 , e 2 , e 3 }.…”
Section: Methodsmentioning
confidence: 99%
“…For Li[CH 2 P t Bu 2 ], we find a volume decrease of about 10 % for every calculated structure. To evaluate this effect, thermal expansion studies were carried out using the program TEV,27 treating the unit cell parameters with a linear model 35. The thermal expansion along the crystallographic b axis (0.0014 Å per K) is more than three times greater than along the other axes ( a : 0.0004 Å per K; c : 0.0004 Å per K).…”
Section: Resultsmentioning
confidence: 99%
“…An example parameter file for the calculations with fixed and free unit cell parameters is deposited in the Supporting Information. The RMSCD (root mean square cartesian displacement) parameters were calculated as suggested by van de Streek et al27…”
Section: Methodsmentioning
confidence: 99%
“…A continuous behaviour is obvious. For processing these data the TEV software [34] has been employed. First, the evolution of the two lattice parameters a and c was fitted to polynomials of different orders.…”
Section: Thermal Expansionmentioning
confidence: 99%