Texture and Microstructure Analysis with High-Energy Synchrotron Radiation

Abstract

The coatings are composed of methyltrimethoxysilane (MTMS), tetraethylorthosilicate (TEOS) and silica particles (LUDOX TM50, size 35 nm) in differing concentrations. Further details on the preparation are given elsewhere [2,4,6] .

Time Evolution in 3D Metal Microstructures — Recrystallization

“…At HASYLAB in Hamburg, Bunge and coworkers [9][10][11] have developed a 'sweeping detector' technique that allows spatially resolved measurements of textures of materials with high orientation resolution. This technique is unique for textural information but does not at present allow threedimensional mapping of microstructures.…”

Frontiers of synchrotron research in materials science

“…23 , 24 The potential for bulk texture analysis has also been demonstrated. 25 The introduction of two-dimensional (2D) detectors for high-energy x-rays has opened up capabilities for large-area reciprocal space mapping, such as for studies of diffuse scattering, 26 simultaneous recording of many 2D powder diffraction rings, so-called Debye-Scherrer rings, 27 leading to advanced texture analysis, 28 three-dimensional x-ray diffraction techniques 29 that map microstructures in volume, and the materials oscilloscope. 30 , 31 In the latter, the intensity distribution of distinguishable diffraction spots, lying on the Debye-Scherrer rings and stemming from individual crystallites, is streaked along a time axis while the specimen undergoes thermomechanical processing, leading to characteristic traces or "timelines" that help to distinguish various deformation and annealing processes, such as grain coarsening, refi nement, subgrain formation, rotation, slip, twinning, (dynamic) recovery, and recrystallization.…”

Neutron and Synchrotron X-ray Studies of Recrystallization Kinetics

“…[12] Automatic microtexture determination using synchrotron X-rays was also realized in the 1980s, [13] and very recently Bunge and co-workers have developed a sweeping detector concept for fast texture measurements using X-rays from a synchrotron source. [14] Fast texture measurements have been used for in-situ studies of recrystallization, and the kinetics of individual texture components (i.e., ensembles of grains with crystallographic orientations within narrow bounds) can thus be calculated directly. [10,11] Examples of the Article published online August 7, 2008 results are shown in Figure 2.…”