Texture Evolution During Bending of a Single Crystal Copper Nanowire Studied by EBSD and Crystal Plasticity Finite Element Simulations

Weber, Florian; Schestakow, Igor; Roters, Franz; Raabe, Dierk

doi:10.1002/adem.200800102

Cited by 15 publications

(8 citation statements)

References 17 publications

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“…However, the spot shapes are significantly different: the spots for S1 are circular, while those corresponding to S5 are ellipsoidal. Similar results have been reported for copper (Weber et al, 2008) and InAs nanowires (Jangir et al, 2017). The ellipsoidal spots have been attributed by these authors to the bending or strain field that develops inside the longer NWs, which control the nanowire merging by mutual misorientation.…”

Section: Resultssupporting

confidence: 83%

Unravelling the strain relaxation processes in silicon nanowire arrays by X-ray diffraction

et al. 2019

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Investigations performed on silicon nanowires of different lengths by scanning electron microscopy revealed coalescence processes in longer nanowires. Using X‐ray diffraction (XRD), it was found that the shape of the pole figure in reciprocal space is ellipsoidal. This is the signature of lattice defects generated by the relaxation of the strain concentrated in the coalescence regions. This observation is strengthened by the deviation of the XRD peaks from Gaussianity and the appearance of the acoustic phonon mode in the Raman spectrum. It implies that bending, torsion and structural defects coexist in the longer nanowires. To separate these effects, a grazing‐incidence XRD technique was conceived which allows the nanowire to be scanned along its entire length. Both ω and ϕ rocking curves were recorded, and their shapes were used to extract the bending and torsion profiles, respectively, along the nanowire length. Dips were found in both profiles of longer nanowires, while they are absent from shorter ones, and these dips correspond to the regions where both bending and torsion relax. The energy dissipated in the nanowires, which tracks the bending and torsion profiles, has been used to estimate the emergent dislocation density in nanowire arrays.

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Section: Resultssupporting

confidence: 83%

Unravelling the strain relaxation processes in silicon nanowire arrays by X-ray diffraction

et al. 2019

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“…A 23 lm long single-crystalline copper nanowire was produced by focused ion beam fabrication (FIB) [176]. The average cross-section of the specimen was 750 Â 750 nm 2 .…”

Section: Texture and Dislocation Density Evolution In A Bent Single-cmentioning

confidence: 99%

“…For stress-strain curves and texture predictions of polycrystals, local models have been shown to be powerful and efficient [108]. However, when the simulation scale becomes smaller such as in studies focusing on nanoindentation [170,171,174], micropillar compression [172], or small-scale beam bending [176], local models can be insufficient due to their inability to describe mechanical size effects.…”

Section: Introduction Of Geometrically Necessary Dislocationsmentioning

confidence: 99%

Overview of constitutive laws, kinematics, homogenization and multiscale methods in crystal plasticity finite-element modeling: Theory, experiments, applications

et al. 2010

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“…There are other physics-based models that also include the geometrically necessary dislocation density, grain size, and grain boundary information directly into the model. These models can effectively simulate the small-scale deformation, such as nano-indentation [29,30], micropillar compression [31], and micro-beam bending [32].…”

Section: Physics-based Modelsmentioning

confidence: 99%

Simulating Heterogeneous Deformation in Polycrystalline Metals using Crystal Plasticity Finite Element Method

Yang¹

2013

PDJ

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This article provides a general review of fundamentals of crystal plasticity finite element method (CPFEM) and its application in simulating heterogeneous deformation in polycrystalline environment. CPFEM is an important simulation tool for microstructurebased mechanical process prediction, and engineering design involving anisotropic metal material media. Besides a brief discussion of the constitutive laws and kinematics of CPFEM, several of its applications in different deformation processes have also been reviewed, including the uniaxial tension of columnar-grain aluminum, the uni-axial tension of polycrystalline copper, and the four-point bending of polycrystalline titanium, etc. These simulations have all been compared with detailed experimental measurements to validate the accuracy of the applied model.

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Texture Evolution During Bending of a Single Crystal Copper Nanowire Studied by EBSD and Crystal Plasticity Finite Element Simulations

Cited by 15 publications

References 17 publications

Unravelling the strain relaxation processes in silicon nanowire arrays by X-ray diffraction

Unravelling the strain relaxation processes in silicon nanowire arrays by X-ray diffraction

Overview of constitutive laws, kinematics, homogenization and multiscale methods in crystal plasticity finite-element modeling: Theory, experiments, applications

Simulating Heterogeneous Deformation in Polycrystalline Metals using Crystal Plasticity Finite Element Method

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