2003
DOI: 10.1016/j.solmat.2003.06.003
|View full text |Cite
|
Sign up to set email alerts
|

Texturisation of multicrystalline silicon solar cells by RIE and plasma etching

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1

Citation Types

0
32
0

Year Published

2003
2003
2022
2022

Publication Types

Select...
9

Relationship

0
9

Authors

Journals

citations
Cited by 53 publications
(33 citation statements)
references
References 5 publications
0
32
0
Order By: Relevance
“…While RIE is usually detrimental for the electrical performance of a photovoltaic absorber layer, [ 15 ] we observe that nanotexturing leads to an improvement in opencircuit voltage ( V oc ) as seen in the currentvoltage ( J -V ) characteristics measured under 1-sun in Figure 2 a. The V oc increases from the initial 615 mV to 740 mV after 2 min RIE and saturates at 770 mV for etching times equal or longer than 10 min.…”
Section: Introductionmentioning
confidence: 69%
“…While RIE is usually detrimental for the electrical performance of a photovoltaic absorber layer, [ 15 ] we observe that nanotexturing leads to an improvement in opencircuit voltage ( V oc ) as seen in the currentvoltage ( J -V ) characteristics measured under 1-sun in Figure 2 a. The V oc increases from the initial 615 mV to 740 mV after 2 min RIE and saturates at 770 mV for etching times equal or longer than 10 min.…”
Section: Introductionmentioning
confidence: 69%
“…Such kind of etching was predominantly by chemical reaction, therefore the surface damage was much lower than ion bombardment damage of other reactive ion etching processes [14][15][16][17][18]. In order to evaluate the impact of the texturing process, the total (specular and diffuse) hemispherical reflectance and microstructure were measured after etching using a Varian Cary 500UV-VIS-NIR spectrophotometer and scanning electron microscopy (SEM) respectively.…”
Section: /[272]mentioning
confidence: 99%
“…Especially challenging is the development of subwavelength structures for optoelectronic applications. The mechanical V-texture method, 1 laser processing, 2 electron-beam lithography and fast-atom beam etching, 3 reactive-ion etching (RIE), 4 and electron cyclotron resonance plasma etching 5 need sophisticated and expensive equipment, while newer techniques such as selfmasking damage-free RIE are promising 6 but are not yet ready for large-scale use.…”
Section: Introductionmentioning
confidence: 99%