The {111} Growth Twins in Tetragonal Barium Titanate

Wu, Yu-Chuan; Lee, Che-Chi; Lu, Hong-Yang; McCauley, Daniel E.; Chu, Mike S. H.

doi:10.1111/j.1551-2916.2006.00948.x

Cited by 20 publications

(41 citation statements)

References 32 publications

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“…9a with the corresponding SADP's in Fig. 9b where parallel zone axes 221 Â Ã == 001 ½ in consistent with the crystallographic orientation relationships determined [37] for the {111} single twins are again obtained. Interfacial dislocations probably lying in twin boundaries [15,26] are indicated.…”

Section: Batio 3 Dielectric Layermentioning

confidence: 88%

“…Starting BaTiO 3 powders for BME-MLCC are usually Asite excess having the Ba/Ti-ratio between 1.000 and 1.005 [27,29,38]. Here, even if Ca 2+ , of a few atomic percent [29], all substituted for the Ti-site, we still have the grain compositions of BaO-excess with the Ba/Ti-ratios of 1.059 and 1.080 that have well exceeded the typical range reported [5] in the literature.…”

Section: Discussionmentioning

confidence: 99%

“…However, no ferroelectric domains were detected from the BaTiO 3 grains. Twinning along {111} is occasionally found [20][21][22]37], both single [20,21,37] and double twins [20,21,37], as indicated by unfilled arrows in Fig. 5a.…”

Section: General Microstructure-om and Semmentioning

confidence: 94%

“…5a. Double twins can be easily distinguished by a thin slab [22,37] running across BaTiO 3 grains. Facetted grain boundaries [10,11], shown by unfilled arrows, suggest a glassy phase that has been etched away.…”

Section: General Microstructure-om and Semmentioning

confidence: 99%

“…8b where the diffraction aperture was placed in crystal part A, interface, and crystal part B, respectively. This is an interface of the coincident-site lattice (CSL) with Σ=3 [14], both the fault vector [15,37] and transformation matrix [14,37] have previously been determined experimentally by others.…”

Section: Batio 3 Dielectric Layermentioning

confidence: 99%

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Microstructure analysis of the Y5V multilayer ceramic capacitors based on BaTiO3

Lee

et al. 2007

J Electroceram

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The Y5V-1206 base-metal electrode (BME) multilayer ceramic capacitor (MLCC) chips have been characterised for crystalline phases using X-ray diffractometry (XRD), and microstructure using optical microscopy (OM), scanning electron microscopy (SEM) and transmission electron microscopy (TEM). The microstructure features found in the Ni electrode and the BaTiO 3 dielectric layer are discussed in terms of the tensile backstresses induced upon firing due to constrained sintering heterogeneously. The chemical compositions containing BaO-excess and additives CaO and ZrO 2 , determined for BaTiO 3 grains by energydispersive spectroscopy (EDS) equipped in the TEM are also reported. However, no rare-earth oxides were found in the grains. The representative microstructure of BaTiO 3 grains containing dislocations is the "solid-solution" type distinctive from the "core-shell" of the X7R compositions. The fact that no ferroelectric domains were detected suggests that the BaTiO 3 grains are pseudo-cubic with the c/a ratio ≈ 1.0.

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Section: Batio 3 Dielectric Layermentioning

confidence: 88%

Section: Discussionmentioning

confidence: 99%

Section: General Microstructure-om and Semmentioning

confidence: 94%

Section: General Microstructure-om and Semmentioning

confidence: 99%

Section: Batio 3 Dielectric Layermentioning

confidence: 99%

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Microstructure analysis of the Y5V multilayer ceramic capacitors based on BaTiO3

Lee

et al. 2007

J Electroceram

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Structure and microwave dielectric properties of Sm(2−x)/3Li x TiO3

2007

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The structural evolution, and microwave dielectric properties of Sm 2Àx ð Þ=3 Li x TiO 3 ceramics (x=0.0≤x≤ 0.5) were investigated in this work. X-ray diffraction (XRD) results show that samples with x>0.3 exhibit a single perovskite phase. Impurity phases of Sm 2 Ti 2 O 7 and TiO 2 appear and their amount increases with the decrease of x when x≤0.3. TEM observation indicates that the A-site is ordered in x=0.5, but not in x=0.3). The dielectric constant decreases with the increase of x for 0.1≤x≤0.4 and then increases with further increase in x up to x=0.5. The Q×f value decreases with the decrease of x due to the increased occurrence of Sm 2 T 2 O 7 secondary phase, defects and twinning boundaries. The temperature coefficient of resonant frequency is negative and its absolute value decreases greatly with the decrease of x value.

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Oxidation-induced strain relaxation and related dielectric-temperature behavior in core/shell grained BaTiO3

Jeon

Kang

2015

J Electroceram

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The effect of oxidation on dielectric-temperature behavior of core/shell grained BaTiO 3 was studied in an attempt to reveal the prime governing parameter of dielectrictemperature behavior. BaTiO 3 samples doped with 3 mol% Y 2 O 3 or 3 mol% Dy 2 O 3 with the same effective charges were sintered in a reducing atmosphere (Po 2 <10 −13 ) and oxidized at 1050-1250°C for 10 h in air. In the Y-doped samples, as the oxidation temperature increased, the fraction of the grains with ferroelectric domains in the shell increased from 18 to 54 % and the residual strain decreased. With an increased domain fraction, the dielectric-temperature behavior became poor, and a dielectric peak appeared. On the other hand, all the Dy-doped and air-annealed samples exhibited relatively high fractions of grains with ferroelectric domains in the shell, 32 % at 1050°C and 63 % at 1250°C, indicating a considerable reduction of residual strain in all the samples. The temperature stability of the Dy-doped samples was poor, and there was a dielectric peak, irrespective of the oxidation temperature. This difference in dielectric response between the Ydoped and Dy-doped samples reveals that the prime factor governing the dielectric-temperature stability is the residual strain in the core/shell grains rather than the previously suggested factors of defect concentration, dopant concentration in the shell and the occupational sites of rare-earth dopants.

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The {111} Growth Twins in Tetragonal Barium Titanate

Cited by 20 publications

References 32 publications

Microstructure analysis of the Y5V multilayer ceramic capacitors based on BaTiO3

Microstructure analysis of the Y5V multilayer ceramic capacitors based on BaTiO3

Structure and microwave dielectric properties of Sm(2−x)/3Li x TiO3

Oxidation-induced strain relaxation and related dielectric-temperature behavior in core/shell grained BaTiO3

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