The 2000 IAEA intercomparison of PIXE spectrum analysis software

Blaauw, M.; Campbell, John L.; Fazinić, Stjepko; Jakšić, Milko; Orlić, I.; Espen, P. Van

doi:10.1016/s0168-583x(01)01016-3

Cited by 47 publications

(20 citation statements)

References 13 publications

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“…The PIXE spectra were fitted using both DataFurnace 40 and OMDAQ 41 (which implements GUPIX 42 , a validated code 43 ). The PIXE data analysis follows a similar method as for SEM-EDS, but for ion beam induced X-rays the absorption correction is far easier to calculate since the bulk of the excitation volume is defined by the beam and not by the collision cascade.…”

Section: Discussionmentioning

confidence: 99%

Accurate determination of the Ca:P ratio in rough hydroxyapatite samples by SEM‐EDS, PIXE and RBS—a comparative study

et al. 2009

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The Ca:P ratio in a certified standard of hydroxyapatite was determined by Xray spectrometry (XRS), with the X-rays excited by both electrons and ions using energy dispersive spectroscopy on the scanning electron microscope (SEM-EDS) and particle induced X-ray emission (PIXE). The certified value of Ca:P was accurately verified by 3 MeV 4 He + Rutherford Backscattering Spectrometry (RBS).We show that the demonstrably rough surface of this sample does not cause perturbation of the Ca:P ratio within the uncertainties of each of the XRS measurements. Paper O4-8, EXRS

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Section: Discussionmentioning

confidence: 99%

Accurate determination of the Ca:P ratio in rough hydroxyapatite samples by SEM‐EDS, PIXE and RBS—a comparative study

et al. 2009

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“…The difference seen for GISA is due to the stopping power data base used, SRIM91, while the other codes used SRIM03. The large difference is due to the large evolution in knowledge about the stopping of 7 Li + and other heavy ions that occurred in the last two decades. The differences within the group that used SRIM03 are small, which shows that the basic algorithms used are correct.…”

Section: Heavy Ion Rbs and Erda Including Multiple Scatteringmentioning

confidence: 99%

International Atomic Energy Agency intercomparison of ion beam analysis software

Barradas

Arstila

Battistig

et al. 2007

Nuclear Instruments and Methods in Physics Research Section B:

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Ion Beam Analysis (IBA) includes a group of techniques for the determination of elemental concentration depth profiles of thin film materials. Often the final results rely on simulations, fits, and calculations, made by dedicated codes written for specific techniques. Here we evaluate numerical codes dedicated to the analysis of Rutherford Backscattering Spectrometry (RBS), non-Rutherford Elastic Backscattering Spectrometry, Elastic Recoil Detection Analysis, and non-resonant Nuclear Reaction Analysis data. Several software packages have been presented and made available to the community. New codes regularly appear, and old codes continue to be used and occasionally updated and expanded. However, those codes have to date not been validated, or even compared to each other. Consequently, IBA practitioners use codes whose validity, correctness and accuracy have never been validated beyond the authors' efforts. In this work, we present the results of an IBA software intercomparison exercise, where seven different packages participated. These were DEPTH, GISA, DataFurnace (NDF), RBX, RUMP, SIMNRA (all analytical codes) and MCERD (a Monte Carlo code). In a first step, a series of simulations were defined, testing different capabilities of the codes, for fixed conditions. In a second step, a set of real experimental data were analysed. The main conclusion is that the codes perform well within the limits of their design, and that the largest differences in the results obtained are due to differences in the 3 fundamental databases used (stopping power and scattering cross section). In particular, spectra can be calculated including Rutherford cross-sections with screening, energy resolution convolutions including energy straggling, and pileup effects, with agreement between the codes available at the 0.1% level. This same agreement is also available for the non-RBS techniques. This agreement is not limited to calculation of spectra from particular structures with predetermined parameters, but also extends to extracting information from real data. In particular, we have shown data from an Sb implanted sample where the Sb fluence was certified with an uncertainty of 0.6%. For this sample, and using SRIM03 stopping powers for 1.5 MeV 4He in Si, the codes were able to extract the Sb fluence with an average 0.18% deviation from the certified value and a 0.11% agreement between the codes. Thus IBA is a suitable technique for accurate analysis where traceability is critical. These results confirm that available IBA software packages are, within their design limitations, consistent and reliable. The protocol established may be readily applied to validate future IBA software as well.

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“…The PIXE data were analyzed using the DATTPIXE code of Reis [15] as implemented in NDF by the LibCPIXE module [16]. LibCPIXE interprets characteristic X-ray line areas (specifically: of Kα1+Kα2 or Lα1+Lα2) extracted from the raw data, in this case using GUPIX ( [27], [28]: with the output giving 2*FHWM centred on the main peak) which is also a validated code [29] (see Fig.1). GUPIX cannot be used for a complete analysis of the profiles since it is not designed as a depth profiling code and cannot handle any but the simplest layer structures.…”

Section: Discussionmentioning

confidence: 99%

Characterisation of thin film chalcogenide PV materials using MeV ion beam analysis

Jeynes

Zoppi

Forbes

et al. 2009

2009 International Conference on Sustainable Power Generation and Supply

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Abstract--There are many technical challenges in the fabrication of devices from novel materials. The characterization of these materials is critical in the development of efficient photovoltaic systems. We show how the application of recent advances in MeV IBA, providing the self-consistent treatment of RBS (Rutherford backscattering) and PIXE (particle induced X-ray emission) spectra, makes a new set of powerful complementary depth profiling techniques available for all thin film technologies, including the chalcopyrite compound semiconductors. We will give and discuss a detailed analysis of a CuInAl metallic precursor film, showing how similar methods are also applicable to other films of interest.

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The 2000 IAEA intercomparison of PIXE spectrum analysis software

Cited by 47 publications

References 13 publications

Accurate determination of the Ca:P ratio in rough hydroxyapatite samples by SEM‐EDS, PIXE and RBS—a comparative study

Accurate determination of the Ca:P ratio in rough hydroxyapatite samples by SEM‐EDS, PIXE and RBS—a comparative study

International Atomic Energy Agency intercomparison of ion beam analysis software

Characterisation of thin film chalcogenide PV materials using MeV ion beam analysis

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