2005
DOI: 10.1002/pssc.200461821
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The (AgInSe 2 ) 1– x (VSe) x system (0 ≤ x ≤ 0.5): X‐ray diffraction and differential thermal analysis measurements

Abstract: . Fn, 64.70.Kb, 81.70.Pg Polycrystalline samples of the (AgInSe 2 ) 1-x (VSe) x system were prepared by the melt and anneal method. The anneal temperature was 900 K and the anneal time one month. The step composition was 0.1 and the weight of each sample approximately 1 g. Additionally, the composition x = 1/3 was also prepared, since these alloys have been reported as electronic, i.e. definite compounds exist in the diagram at precise values of composition, one of them x = 1/3. The stoichiometric relation … Show more

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