The Angular distribution of diffuse light reflected from isolated defects on superfinished spheres

Klingsporn, P.E.

doi:10.2172/12042200

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“…Sl + S2 S3=F (2) holds in which Sl is the distance from 0 to the beamsplitter and S2 is the distance from the beamsplitter to the lens of focal length F. The size of the image at P bears a magnification M' relative to the virtual image size at 0, where the absolute value of M' is given by…”

Section: =mentioning

confidence: 99%

“…and if term by term integration of the series is carried out, the latter relation for A (1,2) can be put in the following form. Let u = krsin8.…”

Section: Transformation Of Light Wave Electric Field Amplitude From Omentioning

confidence: 99%

“…Likewise, the light diffracted by the uppermost portion of the pit varying in radius from R3 to R4 is obtained from A(1,2) by replacing the subscripts 1 and 2 by 3 and 4, respectively . The light intensity I diffracted by the pit into the angle 8 relative to the surface normal is proportional to the total light amplitude squared and is given by The form of the expressions for A(1,2), A (2,3), and A(3,4) make it easy to generalize the model of the pit referred to in Figure 13 to include N-1 sections which are characterized by N different radii. The total light amplitude diffracted at angle e off the normal by a pit of this general type is given For the pit model in Figure 13, the value of N is four, as there are N-1 or three sections characterized by i = 1, ••• N or four different values of radius.…”

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Optical system for automated inspection of highly reflective spherical surfaces

Klingsporn¹

1977

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An optical system was designed for use in automated inspection of superfinished spherical surfaces. Helium neon laser light is used to illuminate a small region on the spherical surface, and the light reflected from the surface is focused to a point on the face of a photodetector array capable of measuring light intensity as a function of both radial and angular coordinates. When an isolated defect such as a pit or scratch is illuminated, a characteristic diffraction pattern, centered about the focused spot, is observed in the plane of the detector array. Theoretical relations were derived which relate the intensities and sizes of the defect diffraction patterns to the type and dimensions of the isolated defect. The latter relations are important for determining defect sizes from photodetector measurements •of the diffraction pattern intensities and thereby establishing surface quality certification criteria. 4 THE BENDIX CORPORATION This report was prepared as an account of work sponsored KANSAS CITY DIVISION by the United States Government. Neither the United States P.O. BOX 1159 nor the United States Energy Research and Development Administration, nor any of their employees, nor any of their KANSAS CITY, MISSOURI 64141 contractors, subcontractors, or their employees, makes any warranty, express or implied, or assumes any legal liability or responsibility fbr the accuracy, completeness or 4 usefulness of any information, apparatus, product or process A prime contractor with the United disclosed, or represents that its use would not infringe pri-States Energy Research and vately owned rights. Development Administration

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Section: =mentioning

confidence: 99%

“…and if term by term integration of the series is carried out, the latter relation for A (1,2) can be put in the following form. Let u = krsin8.…”

Section: Transformation Of Light Wave Electric Field Amplitude From Omentioning

confidence: 99%

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confidence: 99%

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