The application of taper-sectioning techniques for depth profiling using Auger electron spectroscopy

Walls, John M.; Brown, IK; Hall, D. D.

doi:10.1016/0378-5963(83)90008-9

Cited by 21 publications

(1 citation statement)

References 21 publications

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“…Metallographic taper sectioning, a long-established technique in materials tribology (e.g., [9][10][11][12]), was used to facilitate examination of the surface regions of scratched specimens in order to study the scales and subsurface damage adjacent to the scratches. The scratched surfaces were affixed to slanted wedges that were embedded into epoxy mounts.…”

Section: Materials and Experimental Detailsmentioning

confidence: 99%

Effects of prior surface damage on high-temperature oxidation of Fe-, Ni-, and Co-based alloys

Blau

Brummett

Pint

2009

Wear

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Section: Materials and Experimental Detailsmentioning

confidence: 99%

Effects of prior surface damage on high-temperature oxidation of Fe-, Ni-, and Co-based alloys

Blau

Brummett

Pint

2009

Wear

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X‐Ray Photoelectron andAuger Electron Spectroscopy

Turner¹

2000

Encyclopedia of Analytical Chemistry

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The use of X‐ray photoelectron spectroscopy (XPS) and Auger electron spectroscopy (AES) to analyze the surface composition and chemical environment of solids has been well established since about the early 1970s. These approaches find many applications in both basic and applied scientific investigations. The basic principles, i.e. surface sensitivity, the experimental observations employing these procedures, and the working methods, are described. The instrumentation utilized with the commonly available equipment for these approaches is summarized also.

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The application of laser ionization mass spectrometry to the study of thin films and near‐surface layers

Clarke

Ruckman

Davey

1986

Surface & Interface Analysis

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The laser ionization mass analyser, LIMA, was originally developed as a hulk microprohe instrument giving elemental information similar to that obtained from the conventional electron probe microanalyser, but with the advantage of full periodic table coverage. The LIMA is therefore capable of detecting all elements including hydrogen, helium, lithium, and beryllium, which are inaccessible to EPMA. Other advantages of LIMA over EPMA are isotope discrimination and the ability to obtain chemical information from materials as a result of the emission of complex ionic fragments from surfaces under laser irradiation. As experience grew with the use of the prototype LIMA at Aldermaston, it became clear that the technique was a particularly versatile tool which could not only perform well as a bulk microprobe, but with suitable experimental procedures could also be used as a sensitive depth profiling instrument with moderate depth resolution (>0.01 pm). It became apparent that in its performance parameters, and in many of its applications in bulk and surface analysis, LIMA was directly comparable with dynamic SIMS. This paper is, therefore, concerned with the applications of LIMA when operated in a surface sensitive mode. In general, this involves using low power densities, and a defocused laserthe defocusing means that some sacrifice in lateral resolution must be made. Nonetheless, it is shown in this paper that the LIMA has a genuine contribution to make in depth profiling and thin film analysis.

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The application of taper-sectioning techniques for depth profiling using Auger electron spectroscopy

Cited by 21 publications

References 21 publications

Effects of prior surface damage on high-temperature oxidation of Fe-, Ni-, and Co-based alloys

Effects of prior surface damage on high-temperature oxidation of Fe-, Ni-, and Co-based alloys

X‐Ray Photoelectron andAuger Electron Spectroscopy

The application of laser ionization mass spectrometry to the study of thin films and near‐surface layers

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